Texas Tech University System

Stephen Bayne

Shelby Lacouture

Argenis Bilbao

A system, method and apparatus for measuring carrier lifetime of a device comprises subjecting a test device to a voltage via a voltage source associated with the test system, disconnecting the test device from the voltage source, measuring the voltage as a function of time, measuring the current as a function of time, and determining a carrier lifetime of the test piece according to the slope of the measured voltage and the measured current.

Wide injection range open circuit voltage decay system

Methods and systems for imaging a magnetic field as vectors (or scalars if desired) in either two or three dimensions without the need for rastering or relative motion between the sensors and the magnetic field being viewed. A secondary function is to image electric current flow as vectors. Example embodiments can be scaled to fit both large and small applications by using discreet devices or manufacturing with MEMS technologies.

Growing community of inventors

Lubbock, TX, United States of America

Stephen Bayne