Microsemi Corporation

Stephane Legoff

Sam Seiichiro Ochi

Pierre R Irissou

Etienne Colmet-Daage

Methods, systems, and devices are described for providing fault monitoring for light emitting diode (LED) circuits. Embodiments receive an indication from a fault control module that a fault has occurred in a portion of an LED module (e.g., a series string of LEDs). The fault may represent an open fault or a closed fault condition. In some embodiments, a monitoring module receives the fault indication and generates a further representation that the fault has occurred (e.g., for use by external components or systems). In other embodiments, the monitoring module in configured to further indicate which in the LED module has failed, and/or in what fault condition (e.g., open or closed).

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Pibrac, France

Stephane Legoff