Imec

Interuniversitair Microelektronica Centrum (imec)

Stéphane Donnay

Xavier Rottenberg

Geert Van Der Plas

Simone Severi

Veronique Rochus

Murali Jayapala

Pierre Wambacq

Gerd Vandersteen

Yves Rolain

Jozef Verbeeck

Johan Schoukens

A built-in self-calibration system and method for a micro-mirror array device, for example, operating as a variable focal length lens is described. The calibration method comprises determining a capacitance value for each micro-mirror element in the array device at a number of predetermined reference angles to provide a capacitance-reference angle relationship. From the capacitance values, an interpolation step is carried to determine intermediate tilt angles for each micro-mirror element in the array. A voltage sweep is applied to the micro-mirror array and capacitance values, for each micro-mirror element in the array, are measured. For a capacitance value that matches one of the values in the capacitance-reference angle relationship, the corresponding voltage is linked to the associated tilt angle to provide a voltage-tilt angle characteristic which then stored in a memory for subsequent use.

Calibration of micro-mirror arrays

A method for estimating the BER for telecommunication systems, particular those characterized by signals having high crest factors or causing large inband nonlinear distortions. The set of signals used by the system is divided into subsets according to a characteristic such as signal crest factor, and a BER estimation method is chosen for each subset. Signals causing a large BER are simulated more efficiently using a Monte Carlo simulation, while low BER estimations more efficiently use a quasi-analytical method. The method results in improved accuracy because the noise contribution in quasi-analytical methods can be better approximated for signals having a small crest factor range, and drastically reduces the number of experiments, measurements or simulations which are needed to obtain an accurate BER estimation, as compared to standard Monte Carlo techniques.

System and method for determining bit-error rates

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Herent, Belgium

Stéphane Donnay