Micro-Epsilon Messtechnik Gmbh & Co. Kg

Stephan Zweckinger

Robert Wagner

Rainer Hesse

Hannes Loferer

Josef Hochleitner

The disclosure relates to a reference plate for calibrating and/or checking a deflectometry sensor system, said deflectometry sensor system including an image generation device and a capturing device having at least one capturing element, wherein the reference plate includes a reflective surface, and wherein, for the purpose of checking at least one system parameter of said deflectometry sensor system, the reflective surface is provided with a predefined pattern including markings. A corresponding method for calibrating and/or checking a deflectometry sensor system is moreover indicated.

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Fürstenstein, Germany

Stephan Zweckinger