Marposs Societa' Per Azioni

Stefano Pareschi

An apparatus for checking the length (H) of a chamfer () delimited by a first surface () and by an edge (S), comprises two feelers ()&#x2014;movably connected to a same supporting frame ()&#x2014;and respective transducers (). The transducers supply signals (T, T) indicative of displacements of the respective feelers along mutually perpendicular directions (Y, X). A checking method includes moving the supporting frame at a constant speed so that, during the movement, one of the feelers scans the chamfer and the other cooperates with the first surface. The signals of the respective transducers are acquired and transmitted synchronously to a processing unit () which processes them together with information on the mutual position of the two feelers to obtain the length of the chamfer.

Method and apparatus for checking dimensions of a mechanical part

A method for optically checking by interferometry the thickness of an object () being machined comprises a phase of direct checking wherein the spectrum of the result of interference between primary reflected radiations (R) generated by reflection of incident radiations (I) on an external surface () and secondary reflected radiations (R) generated by reflection on an internal surface of discontinuity () of the object is analyzed, and a preliminary phase wherein information relative to the variation of a virtual thickness (D) delimited and defined by a reference surface () and the external surface of the object, indicative of thickness variations of the object being machined. In the preliminary phase, the processing is based on the analysis of the spectrum of the result of interference between primary reflected radiations and reference reflected radiations (Rref) generated by the reflection of the incident radiations on the reference surface, that defines the length of a reference optical path. An apparatus that implements such method for optically checking includes an optical probe () that receives and detects the primary, secondary and reference reflected radiations, and a spectrometer () that analyzes the spectrum of the result of interference.

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San Pietro in Casale, Italy

Stefano Pareschi