Stmicroelectronics S.r.l.

Stmicroelectronics International N.v.

Stefano Corbani

Rita Zappa

Giulio Ricotti

Chirag Gulati

Aldo Romani

Jitendra Dasani

Matteo Pizzotti

Michele Dini

An electronic converter has first and second input terminals, first and second output terminals, a current regulator circuit arranged between the first input terminal and an intermediate node, and input capacitor arranged between the intermediate node and the second input terminal, and an output capacitor. A control circuit block is configured to sense an input voltage, compare the regulated voltage to a reference value and generate a first signal, compare the input voltage to a lower threshold and an upper threshold and generate a second signal, switch the electronic converter between an active mode and an idle mode as a function of the first signal, and switch the electronic converter between a recharge phase and a switching phase as a function of the second signal when the electronic converter is in the active mode.

Electronic converter and method of operating an electronic converter

An embodiment of a method for detecting permanent faults of an address decoder of an electronic memory device including a memory block formed by a plurality of memory cells, including the steps of: selecting an address, which identifies a selected set of memory cells; writing at the selected address a code word generated on the basis of an information word, of the selected address, and of an error-correction code; and then detecting an error within a word stored at the selected address. The method moreover includes the steps of: selecting a set of excitation addresses; writing a test word at the selected address, and then writing an excitation word at each excitation address; and next comparing the test word with a new word stored at the selected address.

Method for detecting permanent faults of an address decoder of an electronic memory device

A circuit for detecting a single bit upset in a dynamic logic circuit includes a latch circuit having an input for receiving a reset signal, and an output for providing a flag output signal, the latch circuit being clocked by a first clock signal, a first transistor having a drain coupled to the output of the latch circuit, a gate for receiving a second clock signal, and a source, and a second transistor having a drain coupled to the source of the first transistor, a gate for receiving a third clock signal, and a source coupled to ground.

Detection of single bit upset at dynamic logic due to soft error in real time

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Pioltello, Italy

Stefano Corbani