Koninklijke Philips Corporation N.V.

Csem Centre Suisse D'electronique Et De Microtechnique Sa&#x2014;recherche Et D&#xe9;veloppement

Steel Peel Ag

Stat Peel Ag

Stefano Cattaneo

Sjoerd Stallinga

Jonas Reinhardt

Ruedi Bieri

Christoph Hofer

A security feature has a plurality of luminescent surface elements, wherein luminescence lifetime varies between the surface elements. In order to verify the security feature, a lock-in imager is used. The security feature is illuminated with excitation light, which is intensity-modulated with a modulation frequency. The luminescent light emitted by the security feature is detected synchronously with the modulation frequency in a plurality of pixels. This is used to determine a measure of a phase shift between the excitation light and the luminescent light in different pixels. The security feature is verified taking account of the measure of the phase shift in different pixels.

Luminescent security feature and method and device for examining it

Provided herein is a collection device for collecting nano particles conveyed in a fluid including: a fluid duct having a fluid inlet and a fluid outlet, a fluid propelling element propelling said fluid through the fluid duct, and a collection element which is arranged in said fluid duct for the collection of nano particles conveyed in said fluid. The collection element includes a collection surface and an enhancement structure arranged in connection with the collection surface. The nano particles are deposited in the region of said collection surface and said enhancement structure and the collection surface with the enhancement structure enhances the spectral properties of said nano particles for a facile analysis of the amount of collected nano particles.

Device for measuring the exposure to small particles, in particular nano tubes

An apparatus for analyzing a fluid of volume V includes a filter having a filter surface or area A, the filter being capable of allowing the fluid to flow through the filter surface. The fluid's volumetric flow density, averaged over the filter surface, is j. The apparatus further includes a scanner for scanning the filter surface with a scan rate B. The area A is optimized based on the volume V, the scan rate B and the volumetric flow density jto minimize the sum of filtering time and scanning time. Instead of one filter, at least two filters may be used each having a different area A. The apparatus also includes a mechanism for selecting one of the filters and placing the selected filter in an operating position, where the scanner scans the filter surface face of the selected filter.

Method and apparatus for rapid filter analysis of fluid samples

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Landquart, Switzerland

Stefano Cattaneo