Incoatec Gmbh

Stefanie Belgard

Carsten Michaelsen

Juergen Graf

An X-ray analysis instrument, in particular, an X-ray diffractometer (), has an X-ray source (; SC) that emits an X-ray beam (), an X-ray optics (), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (') with an aperture opening (&#x2032;) through which at least part () of the X-ray beam () passes. The collimator mechanism (BM) comprises means for gradual movement of the aperture window (&#x2032;) in at least one direction (A/B, x, y) transversely to the X-ray beam (), the aperture opening (&#x2032;) is at least as large as the cross-section () of the X-ray beam () at the location of the aperture window (&#x2032;), and the path of movement (VW, VW) of the aperture window (&#x2032;), which is accessible by the collimator mechanism (BM), in the at least one direction (A/B, x, y) is at least twice as large as the extension (RS, RS) of the X-ray beam () at the location of the aperture window (&#x2032;) in this direction (A/B, x, y). The X-ray analysis instrument offers a wider scope of beam conditioning possibilities.

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Ratzeburg, Germany

Stefanie Belgard