Turbodynamics Gmbh

Multitest Elektronische Systeme Gmbh

Other

Thurmaier, Stefan

Stefan Thurmaier

Benno Stigloher

A docking device for coupling a test device () or storage device () (first device) for interface units () for testing electronic components to at least one handling unit () for handling and/or transporting interface units () (second device), has a first docking element () and a second docking element (), the first docking element () being movable relative to the second docking element () and being fixable in an end position. A sensor arrangement is provided for detecting the end position of the first docking element () relative to the second docking element () on the side of the first device and/or on the side of the second device.

Docking device and method for coupling second devices for interface units, disposition system and docking element

A storage unit is used for storing a plurality of interface units. A disposition system then automatically manages interface units. A carrier is provided for accommodating an interface unit. The interface unit is configured for testing semiconductor elements in corresponding test devices. The storage unit is designed for storing a plurality of interface units, the storage unit having a plurality of compartments, each for accommodating one carrier, and each such carrier being designed to accommodate one interface unit. The storage unit comprises at least one alignment element for positionally accurate coupling of a handling device.

Storage unit and disposition system for storing interface units

The present invention relates to a plate-shaped connection system for the connection of two test units, such as for example a testing device (tester) and a handling device (handler). The handling device serves for the feeding of semiconductor elements to the tester of a test system, for the testing of such semiconductor elements. The plate-shaped connection system comprises a master frame and an insert frame. The master frame is designed for connection with a first of the two test units and one or more docking elements are provided for releasable connection with the other second test unit. The insert frame is designed that it may be connected to the master frame. The insert frame extends inwards from an inner edge of the master frame, wherein the insert frame has mounting elements for the mounting of a test board.

Plate-shaped connection system for the connection of two test units, also connection unit and test system each with such a plate-shaped connection system

The present invention relates to an aligning device and handling device, and in particular to an aligning device for the positionally accurate coupling of a handling device for exchanging an interface unit to another device for receiving at least one interface unit and to a handling device for exchanging an interface unit.

Aligning device and handling device

A guided approach device for guiding together a first device (handler or tester) and a second device (including a test head for electronic components), including a latching device with a cylindrical pin socket for holding and fixing a front end of a catch pin. The latching device is connected to a linear displacement device such that the cylindrical pin socket may be displaced in a linear direction at least a short distance corresponding to a multiple of a length of a leading section of the catch pin, which may be inserted into the pin socket. Additionally or alternatively, the latching device is connected to a linear displacement device such that the latching element, a spring element and the pin socket may be displaced, with the catch pin engaged, in a linear direction by the linear displacement device, so that the first and second devices maybe moved relative to one another.

System and guided approach device for guiding a handler or a tester together with a device including a test head for electronic components

The invention relates to a module for exchanging an approximately planar interface unit in a testing system for testing semiconductor elements. The module includes a base element, a holder, and guide elements. The guide elements are embodied so that the interface unit can be moved by means of a linear, translatory movement from an end position into an intermediate position and from the intermediate position into a removal position that is situated outside the testing system. The mechanism includes a lever mechanism that is controlled by a sliding guide and is supported so that it can move crosswise to the linear translation movement of the holder.

Module for exchanging an interface unit in a testing system for testing semiconductor components and testing system comprising such a module

With a docking device for the coupling of a handler or prober to a test head for electronic components, at least one locking unit is provided, which has an axially displaceable ball element clamping sleeve. This ball element clamping sleeve is surrounded by an annular pressure chamber, closing pressure-tight opposite the introduction area of the locking pin and can be moved in an axial direction by means of a ring piston, which can be actuated by a pressure means introduced into the pressure chamber.

Docking device actuated by pressure means

In a docking apparatus for coupling a first apparatus consisting of a handler or prober and a second apparatus consisting of a testing head for electronic components, at least one locking unit is provided having an axial insertion opening for inserting a locking pin. In the area of the insertion opening, a plurality of balls are arranged, between which the locking pin is insertable. Furthermore, a ball clamping sleeve is provided, which by means of an axial displacement causes a radial movement of the balls and therefore fixes the locking pin.

Docking apparatus

In a guiding apparatus for positionally accurate docking of a testing head for electronic components to a handler or prober, a guiding pin is provided, arranged to be displaceable in a direction normal to its longitudinal direction on an attachment block attached on a testing head or handler/prober. Within the attachment block, a taper pin is provided longitudinally displaceable and carrying a taper tip on its end facing the guiding pin. The guiding pin has a centering recess on its side facing the taper pin. The taper tip can be brought into and out of engagement with the centering recess, wherein by inserting the taper tip into the centering recess a predetermined position of the guiding pin with respect to the attachment block, and therefore with respect to that device, which carries the guiding pin, can be achieved.

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Bad Aibling, Germany

Stefan Thurmaier