Krones Ag

Globalfoundries Inc.

Stefan Richter

Stefan Piana

Hans-Peter Moll

Andreas Kraus

Volker Kronseder

Georg Gertlowski

Roland Ederer

Stefan Scherl

Dieter Lipp

Thomas Eggl

Bernhard DÜNZINGER

Peggy Augst

The present invention provides an inspection device for continuously inspecting supplied containers, in particular bottles, comprising a feed conveying apparatus, which may be embodied to supply containers to the inspection device in succession, and which may include one or more of at least one inspection apparatus, which is embodied to inspect the supplied containers, a discharge conveying apparatus, which is embodied to discharge the inspected containers, and a throughput station for the containers, arranged between the feed conveying apparatus and the discharge conveying apparatus, wherein the throughput station has a transportation apparatus with an individual drive and a plurality of conveying means movable by means of the individual drive in an individual manner and independently from one another, said transportation apparatus being embodied to convey the containers from the feed conveying apparatus to the discharge conveying apparatus.

Device and method for continuously inspecting containers

The present disclosure provides an inspection device for continuously inspecting fed containers, in particular bottles, said inspection device comprising a feed device configured to feed containers thereto in succession, at least one inspection unit, configured to inspect the fed containers, a discharge conveying device configured to discharge the inspected containers, and a throughput station for the containers, which is arranged between the feed conveying device and the discharge conveying device, wherein the throughput station comprises a conveyor arrangement with an individual drive and a plurality of conveying units, which are movable by means of the individual drive individually and independently of one another, the conveyor arrangement being configured to convey the containers from the feed conveying device to the discharge conveying device.

The present disclosure provides a test structure which includes an SOI substrate having an active semiconductor layer, a buried insulating material layer, and a base substrate, wherein the active semiconductor layer is formed on the buried insulating material layer, which, in turn, is formed on the base substrate. The test structure further includes a contact which is formed on the active semiconductor layer and electrically coupled to the active semiconductor layer. Herein, the contact has a tip portion extending through the active semiconductor layer into the buried insulating material layer.

Test structures and method of forming an according test structure

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Thalmassing, Germany

Stefan Richter