Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V.

Albert-ludwigs-universitat Freiburg

Stefan Rein

Markus Glatthaar

Jonas Haunschild

Andreas Brand

Jan Nekarda

Karin Krauss

Fabian Fertig

Nico Wöhrle

Johannes Greulich

Mattias Demant

Aditya Kovval

The invention relates to a method for stabilizing a photovoltaic silicon solar cell, including a regeneration step in which a semiconductor substrate of the solar cell which are heated to at least 50&#xb0; C. is injected with charge carriers. The invention is characterized in that a degradation step is carried out before the regeneration step, wherein the solar cell is subjected to radiation, in particular laser radiation, having an illumination intensity of at least 5.000 W/m2 and the solar cell is simultaneously cooled. The invention also relates to a device for stabilizing a photovoltaic silicon solar cell.

Method and device for stabilizing a photovoltaic silicon solar cell

A method is provided for measuring a semiconductor structure, which allows the spatially resolved determination of dark saturation current and/or series resistance and/or resistance of the emitter layer of the semiconductor structure via luminescence measurement, without restrictions being given such that one of the parameters must be known in advance or spatially consistent.

Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell

A method for spatially determining the series resistance of a semiconductor structure by generating luminescent radiation in the semiconductor structure under measurement conditions A and B, by determining a local calibration parameter Cfor a plurality of prescribed locations of the semiconductor structure and determining local series resistances Rfor a plurality of prescribed locations of the semiconductor structure. It is essential that the local series resistances Rare each determined as a function of a global series resistance Rof the semiconductor structure that is identical for all local series resistances.

Method for spatially determining the series resistance of a semiconductor structure

Growing community of inventors

Denzlingen, Germany

Stefan Rein