Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v.

Friedrich-schiller-universitat Jena

Friedrich-schiller-universitaet Jena

Leibniz-institut Fur Photonische Technologien E.v.

Fried-schiller-universitaet Jena

Friedrich-schiller-universtaet Jena

Carl Zeiss Smt Gmbh

Stefan Nolte

Stefan Xalter

Jens Limpert

Christoph Zaczek

Andreas Tuennermann

Jens Ulrich Thomas

Andreas Tünnermann

César Jáuregui Misas

Gerhard Kalkowski

Ramona Eberhardt

Jürgen Popp

Fabian Stutzki

Daniel Richter

Ralf Steinkopf

Thomas Monz

Christian Voigtlaender

Marco Ornigotti

Christian Vetter

Robert Williams

Christian Voigtländer

Michael Schmitt

Malte Per Siems

Ria Krämer

Alexander Szameit

Tobias Meyer-Zedler

Thorsten Albert Goebel

Roland Ackermann

Herbert Gross

Michael Klasna

Cristian Gleason

Tobias Ullsperger

Chistian Vetter

Soeren Knorr

Maxime Chambonneau

Qingfeng Li

Klaus Bergner

A method and an apparatus for processing an object by generation of laser radiation as a collimated laser beam, influencing the intensity distribution and/or the phase progression over the cross section of the laser beam, splitting the laser beam into two partial beams, and deflection and focusing of the partial beams so that the partial beams are superimposed in a processing zone in the material of the object.

Method and device for machining by means of interfering laser radiation

The invention relates to an arrangement for producing a Bessel beam (), comprising a beam-forming element (), which transforms a beam () incident as a plane electromagnetic wave into a Bessel beam (). According to the invention, the beam-forming element () comprises at least one annular lens (') and a Fourier optical unit, e.g. in the form of a Fourier lens ().

Arrangement for producing a Bessel beam

An exemplary laser microscope can be provided, comprising at least one first laser source which emits at least one (e.g., pulsed) excitation beam, a scanning optical configuration (e.g., configured to scan the excitation beam over the surface of a sample), a focusing optical configuration (e.g., configured to focus the excitation beam onto the sample), and at least one detector configured to detect light emitted by the sample due to an optical effect in response to the excitation beam. A second laser source facilitates a pulsed ablation beam for a local ablation of the material of the sample. The ablation beam can be guided to the sample via the scanning and focusing optical configurations. The first and second laser sources can be fed by a mutual continuous wave pump laser and/or a mutual pulsed pump laser. The first laser source can emit pulses with at least two different wavelengths.

Laser microscope with ablation function

The invention relates to a mode filter for reducing higher-order modes, with an optical fiber (), which has a core () and a cladding () surrounding the latter, wherein the cladding () and core () have refractive indices that differ from one another. In order to develop an alternative to the prior art, the mode filter according to the invention is designed in such a manner that the fiber () has, in a transition region () between core () and cladding (), at least one local refractive index modification region () which is arranged in the radially outer region of the core () and extends into the region of the cladding ().

Mode filter with refractive index modification

The invention relates to a transverse mode filter in an optical waveguide (). The aim of the invention is to produce a transverse mode filter that permits a monolithic construction of a laser in a multi-mode waveguide. To achieve this, according to the invention the filter comprises a Fabry-Perot cavity integrated into the optical waveguide () and comprising two reflective elements () situated at a distance from one another. In addition, the waveguide () is modified in the region of the Fabry-Perot cavity and/or in the region of the reflective elements () in relation to the remaining regions of the waveguide with respect to the effective refractive index of at least one mode of the waveguide.

Transverse mode filter for waveguides

The present invention relates to a method for laser-assisted bonding of substrates, in which these are connected together firstly frictionally by pressing together and subsequently strengthening of the connection between the substrates is effected by activation in regions which is induced by laser irradiation. The invention likewise relates to substrates produced accordingly.

Method for laser-assisted bonding, substrates bonded in this manner and use thereof

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Jena, Germany

Stefan Nolte