Jenoptik Jena G.m.b.h.

Akademie Der Wissenschaften Der Ddr

Stefan Florek

Helmut Becker-Ross

Joachim Mohr

Guenther Moebius

Felix Kerstan

Klaus-Eberhard Engel

Hans-Jurgen Dobschal

Reinhard Tischendorf

Horst Sanders

Wolf-Ekkehard Matzke

Susanne Engel

The invention refers to a device for investigating highly resolved partial spectra of an echelle spectrum, being applicable to the simultaneous determination of the intensities of different spectral elements of a radiation spectrum produced by an echelle spectrometer. The device consists of a position-resolving photoelectric detector including several photosensors arranged on an IC chip, where said photosensors are arranged on the chip surface discretely at the positions of preselected spectral lines, each of the photosensors consisting of a CCD sensor row and a logic circuit which, depending on activation levels, enables supply potentials and clock signals to be connected and output signals to be transferred to a common output signal line; the areas of the individual sensor elements of the CCD sensor rows being matched to the spectral elements of the echelle spectrum and extending successively in the direction of dispersion of the echelle grating; the total number of sensor elements of all CCD sensor rows on the chip being smaller than the number of spectral elements in the echelle spectrum; and a digital logic circuit enabling, by means of the activation levels managed by it, the serial readout of the signals from a selsotable subset of all CCD sensor rows in a selectable order of succession, via the common output signal line, depending on external control signals.

Device for the investigation of highly resolved partial spectra of an

An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

Adjustable echelle spectrometer arrangement and method for its adjustment

The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.

Optical system for spectral analysis devices

Growing community of inventors

Berlin, Germany

Stefan Florek