Leica Microsystems Cms Gmbh

Stefan Christ

Sebastian Simmer

An inverted microscope is provided, the inverted microscope including a microscope stage which includes an opening prepared for transmitted light illumination and which is designed to receive a sample holder and an imaging optical unit arranged below the microscope stage. A closed lower incubation space which surrounds at least the imaging optical unit is arranged adjacent to a lower side of the microscope stage. The inverted microscope is configured such that a temperature in the lower incubation space is adjustable to a specifiable target temperature, for the purposes of which at least one temperature sensor is arranged in the lower incubation space, the measurement signal of the at least one temperature sensor serving to set the specifiable target temperature.

Inverted microscope

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting device is arranged inside the sample chamber facing the sample carrier.

Microscope and method for examining a sample

A microscope for microscopic examination of a sample includes: a microscope housing enclosing an illumination optics, a microscope stage, and an imaging optics; an integrated sample chamber located within the microscope housing; and an integrated reagent chamber located within the microscope housing, the integrated reagent chamber supplying a reagent to the sample.

Microscope for microscopic examination of a sample

The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample preparation arrangement comprising a base and a receiving structure adapted to receive said one or more sample receptacles, said sample preparation arrangement further comprising a pipetting guide movably fixed or fixable in relation to the receiving structure, said pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting said pipetting guide in relation to said base. A method of preparing one or more samples for microscopic examination is also part of the present invention.

Microscopic examination device and method of preparing a sample for microscopic examination

A system for microscopic examination of a sample has a microscope and an incubation environment conditioning unit connected to the microscope. The microscope has a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within the microscope housing. The housing section has a microscope interface for connecting the incubation environment conditioning unit to the sample chamber and/or to a stage top chamber for placing within the sample chamber and for receiving the sample. The system provides a first and a second incubation modes. In the first incubation mode the sample chamber is incubated by supply of a first incubation atmosphere by the incubation environment conditioning unit. In the second incubation mode the stage top chamber is incubated by supply of a second incubation atmosphere by the incubation environment conditioning unit.

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Schoeffengrund, Germany

Stefan Christ