Lecroy Corporation

Tektronix, Inc.

Stanley Joseph Sula

Stephen Mark Sekel

Julie A Campbell

A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip. In one preferred embodiment the probing tip cartridge further includes at least one foot.

Cartridge system for a probing head for an electrical test probe

A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.

The automatic probe identification system of the present invention automatically identifies an electrical test probe as being associated with a particular channel. Specifically, an automatic probe identification system of the present invention includes a testing instrument and at least one test probe. The testing instrument preferably has at least one input channel, each input channel being visually represented by a unique channel identification such as a colored trace. The test probe has a probe identifier such as a full-spectrum LED for selectively visually representing a unique probe channel identification. The probe identifier automatically visually represents a unique probe channel identification corresponding to the unique channel identification of the input channel to which it is coupled. An additional benefit of this system is that the probe identifier used in one preferred embodiment of the test probe provides additional illumination for shadowed or dark places.

Automatic probe identification system

A rotary pulse generator is disclosed which generally includes a wheel rotatable about an axis. The wheel has a plurality of protrusions which deflect a piezoelectric element in a deflection zone. Several embodiments are shown. The various features include a thumbwheel in which the turning surface has teeth on it serving as the protrusions, a thumbwheel in which the teeth are directed radially inwardly, a push/pull knob which places the wheel in alignment with a selected one of three piezoelectric elements, and a wheel held in selected positions by an indent/detent mechanism with rods extending out of the side of the wheel to deflect the piezoelectric element. Yet another embodiment provides for the combination of linear and rotary pulse generation. Another form provides four sets of indicator locations with a location from each of the sets forming an aligned row of indicator locations. The protrusions are disposed selectively in the indicator locations to give each row a unique binary code when sensed by four associated piezoelectric elements.

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Portland, OR, United States of America

Stanley Joseph Sula