Thermo Niton Analyzers LLC

Rigaku Analytical Devices, Inc.

Thermo Scientific Portable Analytical Instruments Inc.

Rigaku Raman Technologies, Inc.

Stanislaw Piorek

Michael Anthony Damento

Mark A Hamilton

Michael E Dugas

Scott Charles Buchter

Lee Grodzins

Stephen I Shefsky

Kenneth P Martin

Paul R Estabrooks

Pratheev Sreetharan

David Steven Mercuro

Richard A Crocombe

Paul Estabrooks

A two-dimensional spectrometer includes a first mirror, a prism, a diffraction grating, a lens, a second mirror, and a two-dimensional sensor. The first mirror is configured to receive the optical signal from the optical entrance and reflect the optical signal towards the prism. After passing through the prism, the optical signal is provided to the diffraction grating. The diffraction grating diffracts the optical signal so as to generate a diffracted optical signal which is directed back through to prism, wherein the lens configured focuses the diffracted optical signal onto the second mirror. The second mirror reflects the diffracted optical signal back through the lens which focuses the diffracted optical signal onto the two-dimensional sensor. The diffraction grating may be an echelle grating.

Compact two-dimensional spectrometer

A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis, an optical assembly configured to direct the beam towards a sample for plasma spectrum analysis of the sample and collect a reflected light reflected by the sample. The optical assembly includes a long-wave pass optical filter arrangement which is configured to pass a first portion of the reflected light reflected by the sample and reflect a second portion of the reflected light reflected by the sample to a spectrometer.

Device for analyzing the material composition of an object via plasma spectrum analysis having a long pass filter

A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.

Device for analyzing the material composition of a sample via plasma spectrum analysis

An analyzer for analyzing a composition of a sample, and methods of operating an analyzer. The analyzer may include an optical illuminator and a Raman spectrometer to produce Raman spectral data representative of Raman radiation emitted from the sample in response to the illuminating light. Features to reduce background fluorescence are optionally provided. An x-ray illuminator may be provided to illuminate the sample with x-rays, and also an x-ray spectrometer may be present to produce x-ray spectral data representative of fluorescence radiation emitted from the sample in response to the illuminating x-rays. A processor receives the Raman spectral data and any x-ray spectral data and provides an analysis of a compound in the sample.

Sample analysis

Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining&#x2014;using a non-destructive mechanism&#x2014;whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only.

Metal authenticity testing of an object using radiation

A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand -held analyzer or provided for external storage or display.

Growing community of inventors

Hillsborough, NJ, United States of America

Stanislaw Piorek