Carl Zeiss Microscopy Gmbh

Stanislav Kalinin

Dieter Huhse

Volodymyr Kudryavtsev

Wolfgang Bathe

Thomas Egloff

Yauheni Novikau

Mirko Liedtke

Alexander Gaiduk

Joerg Engel

Oliver Holub

Burkhard Goetz

Michael Wacke

Alexander Kolarow

Benedikt Lübbers

Markus Jaeger

Markus JÄGER

Burkhard GÖTZ

Jörg Engel

A method can be used for correcting background signals in captured measurement values of analog detectors, wherein measurement values of an object captured over a reference time period are analyzed and characteristic values of captured background signals are determined. What is characteristic of this is that a threshold value is determined on the basis of at least one characteristic value and by applying a calculation specification; the threshold value is applied to captured measurement values of an analog detector, and only those measurement values which are greater than the threshold value are used for a subsequent signal evaluation. A microscope for carrying out the method according to the invention is also provided.

Method for correcting background signals in captured measurement values of analog detectors

Apparatus and method for capturing an image having a detection beam path for guiding detection radiation from a sample to a detector having a plurality of detector elements. The detector has no more than ten and, preferably, four or five detector elements; and an evaluation unit, which is configured to carry out an evaluation in accordance with the Airyscan method on the image data captured by means of the detector and which generates a high-resolution image.

Apparatus and method for capturing an image

In a method for deconvolving image data, image data of an object are captured with a number n of confocal beam paths. The image data are converted into resultant image data by means of a point spread function. The resultant image data are deconvolved again in the frequency domain using a deconvolution function, wherein the deconvolution function contains the formation of at least a number n of sum terms and a Wiener parameter w. The results of the sum terms are stored in retrievable fashion; the Wiener parameter W is modified at least once proceeding from its original value and the deconvolution is carried out by means of the deconvolution function with the modified Wiener parameter w and the stored results of the sum terms.

Method for deconvolving image data

The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Px), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Px) and a row sum is formed in each case. A correction value of the pixel (Px) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Px), of the reconstructed image, as a result of which a corrected image is obtained.

Method for reducing image artifacts

A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

High-resolution confocal microscope

A method for high-resolution scanning microscopy of a sample, wherein the sample is illuminated with illumination light such that the illumination light is focused at a point in or on the sample into an illumination spot. The point is imaged into a diffraction image onto an area detector having detector elements. The area detector has a spatial resolution that resolves a diffraction structure of the diffraction image. The sample is here scanned line-wise in a grid made of rows and columns by displacing the point relative to the sample into different scanning positions with an increment width that is smaller than the diameter of the illumination spot. The area detector is read, and an image of the sample is generated from the data of the area detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.

Method for high-resolution scanning microscopy

A method for correcting colors of a color reproduction of a digital microscope and a digital microscope are described. In a first step of a method according to the invention, a color image of a sample that is to be examined under the microscope is recorded. When the recording is performed, wavelength-dependent properties of a microscope illumination unit that illuminates the sample are determined in order to describe a state of the microscope illumination unit, in that settings selected at the microscope illumination unit are captured. A set of correction values is determined, which is associated with a state of the microscope illumination unit that is selected in accordance with the state of the microscope illumination unit determined when the recording is performed. In a further step, the colors of the recorded color image of the sample are corrected by applying the correction values of the previously determined set.

Growing community of inventors

Weimar, Germany

Stanislav Kalinin