Growing community of inventors

Chandler, AZ, United States of America

Sruti Chigullapalli

Average Co-Inventor Count = 4.74

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 12

Sruti ChigullapalliPaul J Diglio (1 patent)Sruti ChigullapalliTodd R Coons (1 patent)Sruti ChigullapalliNader N Abazarnia (1 patent)Sruti ChigullapalliBoping Wu (1 patent)Sruti ChigullapalliArun Krishnamoorthy (1 patent)Sruti ChigullapalliChristopher Roy Schroeder (1 patent)Sruti ChigullapalliRene J Sanchez (1 patent)Sruti ChigullapalliJoseph F Walczyk (1 patent)Sruti ChigullapalliTodd Michael Young (1 patent)Sruti ChigullapalliLothar Kress (1 patent)Sruti ChigullapalliDavid Won-jun Song (1 patent)Sruti ChigullapalliCharles Clifton Fulton (1 patent)Sruti ChigullapalliLeslie Fitch (1 patent)Sruti ChigullapalliTuan Hoong Goh (1 patent)Sruti ChigullapalliRobert Levi Bennett (1 patent)Sruti ChigullapalliSruti Chigullapalli (3 patents)Paul J DiglioPaul J Diglio (21 patents)Todd R CoonsTodd R Coons (11 patents)Nader N AbazarniaNader N Abazarnia (10 patents)Boping WuBoping Wu (7 patents)Arun KrishnamoorthyArun Krishnamoorthy (7 patents)Christopher Roy SchroederChristopher Roy Schroeder (5 patents)Rene J SanchezRene J Sanchez (4 patents)Joseph F WalczykJoseph F Walczyk (4 patents)Todd Michael YoungTodd Michael Young (3 patents)Lothar KressLothar Kress (2 patents)David Won-jun SongDavid Won-jun Song (2 patents)Charles Clifton FultonCharles Clifton Fulton (2 patents)Leslie FitchLeslie Fitch (1 patent)Tuan Hoong GohTuan Hoong Goh (1 patent)Robert Levi BennettRobert Levi Bennett (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Intel Corporation (3 from 54,688 patents)


3 patents:

1. 10763218 - Electrical devices and methods for forming electrical devices

2. 10228418 - Alignment fixtures for an integrated circuit packages

3. 9377486 - Thermal interface material handling for thermal control of an electronic component under test

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