Siemens Medical Solutions Usa, Inc.

Northwestern University

Srutarshi Banerjee

Miesher Rodrigues

Aggelos K Katsaggelos

Oliver Strider Cossairt

Zihao Wang

Juan Gabriel Serra Pérez

Henry H Chopp

For training to and/or estimating location, energy level, and/or time of occurrence of incident radiation on a solid-state detector, a machine-learned model, such as a neural network, performs the inverse problem. An estimate of the location, energy level, and/or time is output by the machine-learned model in response to input of the detected signal (e.g., voltage over time). The estimate may account for material property variation of the solid-state detector in a rapid and easily calculated way, and with a minimal amount of data.

Inverse neural network for particle detection in a solid-state-devices

A system to process imaging data includes an imaging system configured to capture image data and event data of a scene, compress the image data and the event data, and transmit the compressed image data and compressed event data to a host. The host is operatively coupled to the imaging system, and includes a processor configured to perform object detection on the compressed image data and the compressed event data to identify one or more objects. The processor is also configured to perform object tracking on the one or more objects. The processor is also configured to predict one or more regions of interest for subsequent data capture based on the object detection and the object tracking. The processor is further configured to provide the one or more regions of interest to the imaging system to control capture of additional image data and additional event data by the imaging system.

Bandwidth limited context based adaptive acquisition of video frames and events for user defined tasks

A method of training a neural network modeling physical phenomena of semiconductor material includes receiving plurality of training pairs corresponding to a semiconductor material. Each training pair comprises an input charge to a distinct voxel of the semiconductor material and one or more output signals generated by the distinct voxel in response to the input charge. A neural network is trained using the training pairs. The neural network models the semiconductor material and each voxel is represented in the neural network by a tensor field defined by (i) a location of the voxel within the semiconductor material and (ii) one or more physics-based phenomena within the voxel at the location.

Space time electron-hole charge transport network for solid-state material studies

Growing community of inventors

Chicago, IL, United States of America

Srutarshi Banerjee