Sparkcognition, Inc.

Sriram Ravula

Elad Liebman

Alexandru Ardel

Yash Gandhi

Dimitri Voytan

Georgios Alexandros Dimakis

Mrinal Sen

A method includes using a machine-learning model to determine multiple sets of image data, each representing an estimated solution to an inverse problem associated with multiple waveform return measurements. First image data are based on a first set of waveform return measurements and first model parameters of the machine-learning model, and second image data are based on a second set of waveform return measurements and a second model parameters of the machine-learning model. The method also includes determining, based on the multiple sets of image data, a representative image. The method further includes generating output data that identifies a first area of the representative image as less reliable than a second area of the representative image based on a statistical evaluation of two or more sets of image data of the multiple sets of image data.

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Plano, TX, United States of America

Sriram Ravula