Texas Instruments Corporation

Srinivasa Chakravarthy

Anand Kumar G

Richard Mark Poley

Rubin Ajit Parekhji

Kenneth Michael Butler

Julio C Hernandez

G Anand Kumar

Per Torstein Roine

Krishnasawamy Nagaraj

Prasanth Viswanathan Pillai

Joonsung Park

Christy Leigh She

Kunal Suresh Karanjkar

Aniruddha Periyapatna Nagendra

Venkata Ramanan R

Mohammed Arif

Bhargov Bora

Various embodiments disclosed herein relate to adaptive clock signal management, and more specifically to generating a clock signal at desired frequencies based on inputs to a clock subsystem for peripheral use. A clock subsystem is provided herein that comprises an oscillator configured to provide a clock signal at either a first frequency or a second frequency, and a controller coupled to the oscillator and configured to perform various functions. The controller can be configured to determine a desired frequency of the clock signal based on a state of each input of multiple inputs, wherein the multiple inputs comprise a power mode input and an analog-to-digital converter input, and provide a signal to the oscillator to produce the clock signal at the desired frequency.

Adaptive clock signal management

A method is provided. In some examples, the method includes receiving, at a sequencer circuit of an analog-to-digital converter (ADC), a first request to perform a first conversion. In addition, the method includes determining, by the sequencer circuit, that the ADC is not busy. The method further includes responsive to determining that the ADC is not busy, and by the sequencer circuit, causing the ADC to perform the first conversion. The method also includes receiving, at the sequencer circuit, a second request to perform a second conversion. The method includes determining, by the sequencer circuit, that the ADC is busy and, responsive to determining that the ADC is busy, and by the sequencer circuit, waiting to cause the ADC to perform the second conversion.

Scheduling analog-to-digital conversions

An example device includes: switch circuitry configured to: connect, in a first state based on a control signal, a first switch input to a first switch output and a second switch input to a second switch output; and connect, in a second state based on the control signal, the first switch input to the second switch output and the second switch input to the first switch output; an operational amplifier configured to: generate, in response to the control signal, a first voltage based on a gain and the connections in the first state; and generate, in response to the control signal, a second voltage based on the gain and the connections in the second state; and an Analog to Digital Converter (ADC) configured to convert the first voltage and the second voltage into a digital value based on a multiplication of the input voltage and the gain.

Methods and apparatus to reduce error in operational amplifiers

Methods for operating two or more analog-to-digital converters (ADCs) are presented herein. The method may be implemented in an integrated circuit. The integrated circuit may include a first ADC and a second ADC disposed on a single semiconductor die. The integrated circuit may also include logic circuitry operably coupled to the first and second ADCs. For a digital value obtained by conversion, by the first ADC, of a first analog signal sampled by the first ADC during a period of time overlapping with another period of time during which a second analog signal is being converted by the second ADC, the logic circuitry may be configured to cause the digital value to be marked as noisy.

Analog-to-digital convertors positioned on a single semiconductor die

Methods, apparatus, systems, and articles of manufacture are disclosed. An example apparatus includes interface circuitry to receive an analog signal. The example apparatus also includes sequencer circuitry to: determine whether the apparatus is to operate in a single transfer state or a multiple transfer state; access a configuration from a control register in a plurality of control registers; initiate a conversion of the analog signal to a digital value based on the configuration; and write the digital value to a result register in a plurality of result registers based on the determination.

Methods and apparatus to write data to registers

An example apparatus includes multiplexer circuitry configured to couple a communication module to at least one of a data bus input or a test signal; and embedded pattern generator (EPG) circuitry coupled to the multiplexer circuitry, the EPG circuitry including: clock divider circuitry including a plurality of clock outputs, the clock divider circuitry configured to be coupled to an output of a clock, the plurality of clock outputs configured to be of a frequency equal to a division of a frequency of the output of the clock; a multiplexer including a multiplexer output, the multiplexer configured to couple one of the plurality of clock outputs to the multiplexer output; and signal generator circuitry including an input clock, an EPG input, and a plurality of data outputs, the input clock coupled to the multiplexer output, the signal generator circuitry configured to generate a data stream.

Embedded pattern generator

In an example, a circuit includes a first comparator, a second comparator, a pulse counter, a processor, a first ADC, and a second ADC. The first comparator has a first input coupled to a first node, a second input, and an output. The second comparator has a first input coupled to a second node, a second input, and an output. A first DAC is coupled to the second input of the first comparator. A second DAC is coupled to the second input of the second comparator. The pulse counter has a first input coupled to the output of the first comparator and a second input coupled to the output of the second comparator. The first ADC has an input coupled to the first node and an output coupled to the processor. The second ADC has an input coupled to the second node and an output coupled to the processor.

SINCOS encoder interface

Sincos encoder interface

A method generates test vectors for a customer designed integrated circuit having an embedded vendor circuit. The embedded vendor circuit has a proprietary circuit and a nonproprietary circuit. At least one pseudo input is defined to represent a portion of the nonproprietary circuit to emulate the nonproprietary circuit output. An output node of the embedded vendor circuit to which an input of the customer designed circuit is connectable is identified. A test netlist is created which represents circuitry that produces output states at the output node which would be generated by the embedded vendor circuit thereat. The test netlist includes at least one pseudo input and the output node, without including a full netlist of either the proprietary or nonproprietary circuits, and can be used to generate scan test vectors for the customer designed integrated circuit by the automatic test vector generating software program.

Generating an abbreviated netlist including pseudopin inputs and output nodes

A method for enabling test vectors to be generated for a customer designed integrated circuit having an embedded vendor circuit is disclosed. The embedded vendor circuit has a proprietary circuit and a nonproprietary circuit. At least one pseudo input is defined to represent a portion of the nonproprietary circuit to emulate the nonproprietary circuit output. An output node of the embedded vendor circuit to which an input of the customer designed circuit is connectable is identified. A test netlist is created which represents circuitry that produces output states at the output node which would be generated by the embedded vendor circuit thereat. The test netlist includes at least one pseudo input and the output node, without including a full netlist of either the proprietary or nonproprietary circuits, and can be used to generate scan test vectors for the customer designed integrated circuit by the automatic test vector generating software program.

Growing community of inventors

Bengaluru, India

Srinivasa Chakravarthy