Texas Instruments Corporation

Srinivasa B S Chakravarthy

Rubin Ajit Parekhji

Anand Kumar G

Aniruddha Periyapatna Nagendra

Prohor Chowdhury

Srinivasulu Alampally

Swathi Gangasani

Padmini Sampath

A method is provided. In some examples, the method includes receiving, at a sequencer circuit of an analog-to-digital converter (ADC), a first request to perform a first conversion. In addition, the method includes determining, by the sequencer circuit, that the ADC is not busy. The method further includes responsive to determining that the ADC is not busy, and by the sequencer circuit, causing the ADC to perform the first conversion. The method also includes receiving, at the sequencer circuit, a second request to perform a second conversion. The method includes determining, by the sequencer circuit, that the ADC is busy and, responsive to determining that the ADC is busy, and by the sequencer circuit, waiting to cause the ADC to perform the second conversion.

Scheduling analog-to-digital conversions

A built-in self-test (BIST) diagnostic system tests the execution of a processor. The processor is arranged to execute a normal application for controlling a process that is external to the processor. The normal execution is executed in normal execution timeslots that have idle timeslots that are interspersed in time between the normal execution timeslots. A BIST controller is arranged to detect the presence of an idle timeslot in the execution of the processor and to use a scan chain to scan-in a first test pattern for a test application for testing the processor. The first test pattern is executed by the processor during the detected idle timeslot and a first result pattern generated by the execution of the first test pattern is scanned-out. The scanned-out first test pattern is evaluated to determine the presence of an error. The first test pattern application is conditionally interruptible.

Interruptible non-destructive run-time built-in self-test for field testing

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Bengaluru, India

Srinivasa B S Chakravarthy