Synopsys, Inc.

Sridhar Rajakumar

Ganapathy Parthasarathy

Saurav Nanda

Bhuvnesh Kumar

Certain aspects of the present disclosure are directed towards a method for circuit testing. The method generally includes: determining a probability distribution indicating prior failure probabilities associated with a circuit design; determining a first likelihood associated with occurrence of at least one failure for the circuit design; determining a quantity of test instances to be performed using simulation to detect the at least one failure based on the probability distribution and the first likelihood; and outputting the quantity of test instances.

Growing community of inventors

Fremont, CA, United States of America

Sridhar Rajakumar