Stmicroelectronics International N.v.

Stmicroelectronics (grenoble 2) Sas

Sri Ram Gupta

Nicolas Moeneclaey

Ankur Bal

Shyam Somayajula

Lionel Cimaz

Rupesh Singh

Sarika Kushwaha

A successive approximation analog-to-digital converter includes a digital-to-analog converter DAC configured to receive a digital signal. First conversion units of the DAC are configured to sample an analog signal via a first switch and provide a first level voltage. Each first conversion unit includes a first capacitor array and a first switch array controlled from the digital signal. A single second conversion unit of the DAC is configured to provide a second level voltage. The second conversion unit includes a second capacitor array and a second switch array. A comparator operates to compare each of the first level voltages to the second level voltage and to provide a comparison signal based on each comparison and actuation of a set of third switches. A control circuit closes the first switches simultaneously and closes the third switches successively for the conversion of each sampled analog signal.

Multichannel successive approximation analog-to-digital converter

According to one aspect, an ambient-light sensor includes a photodiode configured to generate an electrical signal according to an ambient light, a capacitive-feedback transimpedance amplifier connected at its input to the photodiode for receiving a signal generated by the photodiode and for generating as an output an amplified signal from the signal generated by the photodiode, and an auto-zero switch at the input of the capacitive-feedback transimpedance amplifier. The ambient-light sensor further includes a control circuit including a bootstrap circuit configured to receive an initial positive- or zero-voltage logic control signal, and then generate, from this initial logic control signal, an adapted logic control signal having a first positive voltage level and a second negative voltage control level for controlling the auto-zero switch.

Ambient light sensor and method

An integrated circuit includes a successive approximation register (SAR) analog-to-digital converter (ADC). The ADC includes a bit step selector. During testing of the ADC, the bit step selector selects a number of bits to be tested for a next analog test voltage based on digital values that are within an integer delta value of most recent digital value for a most recent analog test voltage.

Method and device for testing successive approximation register analog-to-digital converters

A device may be associated with a power source. The device may include a charge pump configured to output a pulse-width modulated voltage based upon an input voltage from the power source, with the pulse-width modulated voltage varying between a first voltage and a second voltage. The device may also include a low-pass filter comprising an output capacitor, with the output capacitor being configured to average the pulsed-width modulated voltage and to output a filtered voltage having a value different than that of the input voltage. The device may further include a controller configured to selectively decouple the charge pump from the power source when a load imposed on the low-pass filter is below a threshold load.

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Bengaluru, India

Sri Ram Gupta