Nvidia Corporation

Sreedhar Narayanaswamy

Divya Ramakrishnan

Swanand Santosh Bindoo

Benjamin Faulkner

Tao Li

Mini Rawat

Jonah Matthew Alben

Shantanu Sarangi

Brian Lawrence Smith

Gunaseelan Ponnuvel

Hari Unni Krishnan

Hemalkumar Chandrakant Doshi

Tom Li

Padmanabhan Kannan

Peng Cheng Shen

Amey Y Marathe

Srinivasan Raghuraman

A system to select graphics processing units (GPUs) to execute a task is disclosed. In at least one embodiment, GPUs are selected based on one or more task parameters and one or more fused parameters.

Static data center power balancing and configuration

Apparatuses, systems, and techniques to power balance multiple chips. In at least one embodiment, a system includes a plurality of processors having substantially equal performance capability and different power consumption capability, where a cumulative power consumption of the processors is not to exceed a system power threshold if each processor is operated at substantially peak performance.

Techniques to power balance multiple chips

Apparatuses, systems, and techniques to optimize processor performance. In at least one embodiment, a method increases an operation voltage of one or more processors, based at least in part, on one or more error rates of the one or more processors.

Techniques to modify processor performance

A datacenter power management system and method is disclosed. A plurality of computing units are enabled to operate at a second frequency, higher than a first frequency, in response to determining from respective power coefficients for these computing units, that a power level at this higher frequency remains below a power budget.

Programmable power balancing in a datacenter

Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.

Hardware-controlled updating of a physical operating parameter for in-field fault detection

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Sunnyvale, CA, United States of America

Sreedhar Narayanaswamy