Apple Inc.

Srdjan D Sobajic

Giovanni Gozzini

Benjamin B Lyon

Peter G Panagas

James L McPeak

Anuj Bhatnagar

Richard W Lim

Nelson Fong

A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.

Testing a layer positioned over a capacitive sensing device

A test system may include test stations for testing a device under test. The test stations may each include test equipment that may be connected to a device under test using a test cable. The test cable may include a status indicator to indicate when tests have been passed or have failed. A first connector at one end of the test cable may be coupled to the test equipment. A second connector at an opposing end of the test cable may be coupled to the device under test. Communications through the first connector may use a first communications protocol. Communications through a first set of contacts in the second connector may use the first communications protocol. Communications through a second set of contacts in the second connector may use a second communications protocol.

Test systems with cables that support multiple communications buses

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Cupertino, CA, United States of America

Srdjan D Sobajic