Electro Scientific Industries, Inc.

Spencer Barrett

Kenneth V Almonte

David W Newton

Barry Klinger

Shi Li

Jasmine Lu

Kent Robinson

Jon Paulsen

Mark Alan Unrath

Ho Wai Lo

Douglas John Garcia

Donald R Cutler

Corey M Dunsky

Vernon P Cooke

Donald R Wilt

Brandon John McCurry

Raman Sudhakar

Charles Bickford

Ken Whiteman

A plurality of capacitors is subjected to a test cycle of charging, soaking and discharging. While in the soaking cycle, a plurality of measurements of current is obtained. The data is used to train a predictive function. Then, a test capacitor is charged and soaked for a shorter period than the plurality of capacitors. The current through the test capacitor is measured more than once during its soak period, and the measured current values are applied to the predictive function to predict whether the current through the test capacitor at the end of the soak time period would be higher than a predetermined value, thus indicating failure of a leakage test by test capacitor.

Multivariate predictive insulation resistance measurement

An improved method and apparatus for testing and sorting electro-optic devices by both electrical and optical properties at high speed is disclosed. Electro-optic devices, in particular light emitting diodes, are singulated by a singulation device and transferred to a linear track where they are tested for electrical and optical properties. The devices are then sorted into a large number of different bins depending upon the tested properties.

Testing and sorting system having a linear track and method of using the same

An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between test positions to electrically insert a test device selectively between any one contact pair, and a control program. The test device can be selected from a group consisting of a volt meter, a current meter, a precision voltage/current source, a calibration resistor, and a calibration capacitor. The control program can perform at least one test function through the plate. The test function can be selected from a group consisting of alignment verification, voltage/current source verification, insulation resistance (IR) leakage measurement verification, part-present contact check verification, capacitance and dissipation (CD) measurement verification, IR/CD compensation, and IR/CD calibration.

Electrical tester setup and calibration device

An electronic testing machine that tests electronic components using test contacts is disclosed. A contact takes a plurality of electrical readings for a component retained in a test plate as the test plate is moved in microsteps. These electrical readings can be used to determine alignment and/or to correct alignment as necessary using an adjustment mechanism.

Automated contact alignment tool

A method and apparatus for synchronizing plural test devices coupled to a host. A counter of each of the devices is initialized, and each of the counters is incremented, such as by a periodic signal indicating a start of a data stream. An action, typically either a source signal or a measurement signal, is triggered when a respective counter reaches a programmed counter value.

Synchronizing control of test instruments

A method for determining the alignment of a plurality of contacts in an electronic testing machine is disclosed. The contacts are swept over an electronic component taking a plurality of electrical readings. These electrical readings are charted against a desired orientation to determine alignment. Alignment can be corrected as necessary using an adjustment mechanism.

A tertiary positioner system ( ) of this invention employs X- and Y-axis translation stages ( ), galvanometer-driven mirrors ( ), and a fast steering mirror (&ldquo;FSM&rdquo;) ( ) to direct a laser beam ( ) to target locations ( ) on a workpiece ( ). A positioning signal is received by a low-pass filter ( ) that produces filtered position data for driving the X- and Y-axis translation stages. The actual positions of the X- and Y-axis translation stages are subtracted from the unfiltered positioning data to produce an X-Y position error signal for driving the galvanometer-driven X- and Y-axis mirrors. The actual mirror positions are subtracted from the actual positions of the X- and Y-axis translation stages to generate a positional error signal representing the difference between the commanded and actual positions of the laser beam. The positional error signal drives the FSM to rapidly correct any positional errors.

Laser beam tertiary positioner apparatus and method

A single pass actuator ( ), such as a deformable mirror ( ), quickly changes, preferably in less than 1 ms, the focus and hence the spot size of ultraviolet or visible wavelength laser pulses to change the fluence of the laser output ( ) at the workpiece surface between at least two different fluence levels to facilitate processing top metallic layers ( ) at higher fluences and underlying dielectric layers ( ) at lower fluences to protect bottom metallic layers ( ). The focus change is accomplished without requiring Z-axis movement of the laser positioning system ( ). In addition, the spot size can be changed advantageously during trepanning operations to decrease via taper, reduce lip formation, increase throughput, and/or minimize damage.

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Beaverton, OR, United States of America

Spencer Barrett