Cisco Technology, Inc.

Soumya De

Yaochao Yang

Scott Hinaga

Davie Senk

Hui Wu

Techniques are disclosed to determine the temperature-dependent insertion loss and propagation delay of traces in a printed circuit board design. For example, an example method includes determining a first temperature at a first portion of a trace of a PCB design based on a thermal map of the PCB design. The method further includes determining a second temperature at a second portion of the trace based on the thermal map. The method further includes calculating a temperature-dependent property of the PCB at the first portion based on the first temperature. The method further includes calculating the temperature-dependent property of the PCB at the second portion based on the second temperature. The method further includes calculating at least one of a signal loss and propagation delay on the trace based on the temperature-dependent property of the PCB at the first portion and the second portion.

Temperature-dependent printed circuit board trace analyzer

In one embodiment, an apparatus includes a contact contained within a connector configured to couple with a mating connection to provide a communications data path through the connector, a ground shroud extending over a portion of the contact, and a self-terminating element connected to one of the contact and the ground shroud and configured for engagement with the other of the contact and the ground shroud when in an engaged position with the connector uncoupled from the mating connection to terminate signals transmitted to the connector, and disengagement when in a disengaged position with the connector coupled with the mating connection.

Self-terminating backplane connector

In one embodiment, a method includes capturing an image of a piece of a printed circuit board (PCB) that includes at least one inner layer having a metal foil portion. The piece of the PCB includes a cross-section of the inner layer having the metal foil portion. The method also includes determining a surface roughness of the metal foil portion, wherein determining the surface roughness of the metal foil portion includes processing the image.

Growing community of inventors

Santa Clara, CA, United States of America

Soumya De