Georgia Tech Research Corporation

University of Florida Research Foundation Inc

Soumendu Bhattacharya

Abhijit Chatterjee

Sankar Nair

William Richard Eisenstadt

Rajarajan Senguttuvan

Vishwanath Natarajan

Dong Hoon Han

Selim Sermet Akbay

Systems and methods are disclosed for evaluating the length of elongated elements in a sample. The disclosed systems and methods may include using a direct current stimulus to determine a direct current base length region corresponding to at least a portion of the sample. Furthermore, the disclosed systems and methods may include using an alternating current stimulus to determine that the direct current base length region corresponds to a first set of elongated elements and a second set of elongated elements. The first set of elongated elements may have a first base length and the second set of elongated elements may have a second base length. The elongated elements may comprise, for example, chain molecules, deoxyribonucleic acid (DNA), ribonucleic acid (RNA), or proteins. Furthermore, the disclosed systems and methods may include measuring an ion current through a nanopore, the ion current produced by the alternating current stimulus.

Methods and systems for evaluating the length of elongated elements

Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.

Self-calibration systems and methods

A bit error rate test on a transceiver is accelerated by adding a phase offset to data phase encoding and decoding in the transceiver and by mapping bit error rate test results from an elevated error rate condition to a normal error rate condition for the transceiver. The elevated error rate is accomplished by adjusting the phase of the phase encoder and decoder with the value of the phase offset so that the encoded data transmission signal is not as robust against noise as it normally would be. Noise in the form of an interference signal is introduced during the transmission, and the bit error rate is measured after the receiver has decoded the signal. The bit error rate (BER) data with an elevated propensity for error is mapped against bit error rate data for normal operations. A mapping function is built to map BER(bit error rate elevated) data&#x2014;data from the elevated error rate condition for data encoding, to BER(normal bit error rate) data&#x2014;data from the normal error rate condition for data encoding. The BERdata is mapped to BERdata using the mapping function so that the BER performance of the transceiver may be measured using far fewer test sequences of digital bits.

Measuring bit error rate of radio frequency transceivers

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Atlanta, GA, United States of America

Soumendu Bhattacharya