Hitachi, Ltd.

Soshi Narishige

Masahiro Koike

Akira Nishimizu

Mitsuteru Inoue

Hiroyuki Takagi

Hisashi Endo

Hirofumi Ouchi

Yoshiharu Abe

Yuuichi Narumi

Provided are an inspection device and an inspection method capable of achieving improved magnetic field sensitivity by using a magnetic thin film of a small film thickness. A light-emitting unitemits light of a first wavelength for acquiring magnetic field inspection information and a second wavelength for acquiring inspection object surface information. A selection unitselects information from an inspection objectand information from a magnetophotonic crystal filmacquired by light irradiation performed by an irradiation unit. An image generation unitgenerates image data based on the magnetic field inspection information acquired with the first wavelength and the inspection object surface information acquired with the second wavelength selected by the selection unit. Each of the generated image data is displayed on a display unit

Inspection device and inspection method

An eddy current flaw detection sensor is provided which can detect a circumferential crack occurring at the deformed portion or peripheral portion thereof of a heat transfer tube with a high degree of sensitivity. Two excitation coilscause eddy current B to flow in the axial direction of a tubular test objectA detection coildisposed between the excitation coilsdetects bypass eddy current D which flows in the circumferential direction of the test objectwhile bypassing a circumferential crack E. For this purpose, the coil axes of the excitation coilsare directed to the radial direction of the cylindrical protection memberand the coil axis of the detection coilis directed to the axial direction of the protection member

Eddy current flaw detection sensor and method

Growing community of inventors

Tokyo, Japan

Soshi Narishige