Samsung Electronics Co., Ltd.

Sooyong Park

Jae Hyun Kim

Juho Kim

Yongjeong Kim

Kijae Song

Ungjin Jang

Seonggwon Jang

Yousok Min

Yong Chul Jang

Juwon Kim

Woochul Park

Dongyeol Kwak

Wonbin Jo

An electronic device includes a housing including a front surface, a rear surface that is opposite to the front surface, and a side surface enclosing an inner space between the front surface and the rear surface, a display that is visually exposed to the outside of the electronic device, and a printed circuit board that is in the inner space. The printed circuit board includes a plurality of circuit boards that are parallel to one another and include electrical elements and one or more interposers that are between the plurality of circuit boards and connecting a pair of circuit boards adjacent to each other in a height direction. The one or more interposers include one or more via holes, a via and one or more interposer through holes.

Electronic device including printed circuit board

A test device configured to test a device under test (DUT) performing an interface of a pulse amplitude modulation (PAM) operation includes a logic generation/determination device configured to generate multiple bits corresponding to a test pattern, first and second drivers configured to generate respective first and second non return to zero (NRZ) signals according to a logic state of respective first and second bits among the multiple bits and output the respective generated first and second NRZ signals via respective first and second channels. The first NRZ signal has a first high level or a first low level according to the logic state of the first bit, and the second NRZ signal has a second high level or a second low level according to the logic state of the second bit. The first and second high levels are different from each other.

Test devices, test systems, and operating methods of test systems

An impedance matching device includes a tapered strip line and a plurality of strip lines. The tapered strip line extends in a first direction on a substrate and has a width in a second direction perpendicular to the first direction. The tapered strip line includes first to n-th segments having identical lengths and different widths, wherein the 'n' is a natural number of two or more. The plurality of strip lines are connected to the n-th segment such that an input signal received through the first segment is split.

Impedance matching device for reducing reflection loss by splitting digital signal and test system having the same

Provided is a test board including a main board which is configured to be connected to a plurality of devices-under-test (DUTs) and includes a plurality of test signal paths for transmitting a plurality of test signals input from an external tester to pins of at least one of the DUTs or transmitting a test result from the DUT to the tester, and a farm board which is connected to the main board and configured to mount therein a plurality of passive elements which are configured to be connected to at least one of the pins of the DUT through at least one of the test signal paths of the main board, when a test operation is performed, thereby improving a power integrity property or a signal integrity property in the test operation.

Test board, test system including the same, and manufacturing method thereof

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Asan-si, South Korea

Sooyong Park