Emage Vision Pte. Ltd.

Microview Technologies Pte Ltd

Visionxtreme Pte Ltd

Emage Ai Pte Ltd

Saedge Vision Solutions Pte. Ltd.

Viralint Pte Ltd

Emage Equipment Pte. Ltd.

Soon Wei Wong

Victor Vertoprakhov

Tian Poh Yew

Kundapura Parameshwara Srinivas

Sergey Smorgon

WenSen Zhou

Ashedah Binti Jusoh Noor

Wen Sen Zhou

Soon Chye Lian

Ah Kow Chin

Kundapura Paremeshwara Srinivas

Choong Fatt Ho

Trung Hieu Nguyen

Illumination systems and methods of designing and construction of the same are disclosed. The resulting illumination systems comprising both Front and Back light modules, provides selectable and programmable illumination according to the requirements of the invention for optimal performance of enhancing defects on a multidimensional object. The light guides are suitably aligned to the Backlight module and mechanically integrated with spring loaded mechanisms to enable them to move freely and subsequently re-postion them to a reference home position as determined at the time of setup of the illumination assembly. The Front light module is utilised to highlight surface defects and mechanically integrated to the illumination system. The illumination modules, may include multiple discrete light emitting components of different spatial intensity distribution and color spectrum mounted in specific layout such that the application oriented combined illuminating effect is created.

Adaptive lighting system and method for inspection of complex objects

Toolable modules, each having a set of functions and capabilities which are configurable to function cooperatively, to create a set of Robotic arms. Each finger of the module enables a specific task to be accomplished, providing multiple degrees of movements, enabling the Robotic arms to be deployed in highly precise applications and capable of responding to complex tasks. In coordination with an imaging system and a control system the functionality of the Robotic arms are programmable, scalable and configurable in addition to being able to communicate with the external interfaces in a predetermined protocol, thereby providing 'Plug and Play' functionality.

Adaptable multifunction robotic hands

The invention is a computer implemented process directed towards a Deep learning neural network architecture to create object detection model using high resolution images. More specifically, the invention is directed towards enhancing the classification accuracy and reliability of edge inspection in contact lenses. The invention is a Computer implemented process to represent a software architecture comprising software components and their inter dependencies that represents the core functional modules of an application. The system and method of the invention captures a high resolution image, transforms the circular edge of the lens to a Horizontal line representing the circular edge, restricting the image size by eliminating the pixel information around the edge, dividing the horizontal edge image into overlapping portions, and stacking the extracted images vertically to form a single high-resolution image that is ideal to be processed and analysed by Convolution Neural networks after augmenting the original image dataset with new images generated by Generative Adversarial Networks, to enable accurate classification of the defects.

Computer implemented process to enhance edge defect detection and other defects in ophthalmic lenses

An apparatus and method for measuring loop height of overlapping bonded wires, interconnecting the pads of a single or stacked silicon chips to the pads of a substrate taking the steps of: focussing of an optical assembly at multiple points of the bond wire including overlapping bond wires, capturing an image of the bond wire at each of the predetermined focused points; calculating the height of each point of the wire with respect to a reference plane; and tabulating the height data using the X, Y and Z coordinates.

Loop height measurement of overlapping bond wires

The present invention relates to an inspection system and more particularly to a system and method for inspection of wet ophthalmic lens, preferably in an automated lens manufacturing line. The inspection system provides for capturing multiple images of an ophthalmic lens using multiple cameras, each with a customized optical unit which may use wavelength filters, and the ophthalmic lens illuminated by multiple lighting modules each configured for a different wavelength, or a different polarization and triggered to strobe the illumination at the same instance or at different instances in the time domain. Suitable filters used in the optical module for each camera ensures appropriate images at different illuminating wavelength, especially when all the illuminations are strobed at the same time. Images captured and inspected by this configuration aids in improvement in method of inspection with enhanced degree of reliability and quality.

System and method for inspection of wet ophthalmic lens

An embodiment of a method and system for inspecting clear and printed contact lenses is provided. A contact lens is inspected by illuminating the contact lens using bright-field illumination and low-angle dark-field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of a dynamic range of brightness, and to identify bright defects in the image that are in a second portion of the dynamic range of brightness.

Inspection of defects in a contact lens

There is provided an apparatus and method for inspecting a semiconductor package. The apparatus includes at least one 3D camera positioned at a first angle relative to a normal axis of the semiconductor package; and a light source configured to provide illumination for the at least one 3D camera, the light source being directed at the semiconductor package. The method includes casting a shadow of a bonded wire onto the semiconductor package; obtaining a 3D image of the semiconductor package; determining a distance S of the shadow and the bonded wire in the image; and obtaining a wire loop height H of the bonded wire.

Apparatus and method for inspecting a semiconductor package

An embodiment of a system and a method for inspecting a contact lens is provided. The illumination system illuminates the center zone and the peripheral zone of the contact lens when it is inside a cavity between a male mold and a female mold. The imaging optical system has two channels to capture two images or a composite single image to inspect the entire contact lens. The imaging optical system of the first channel has its entrance pupil far away from the mold tool. The camera of the first channel is used to capture the image of the center zone of the contact lens. The image optical system of the second channel is located outside the mold tool but its entrance pupil is located inside the mold tool or outside but substantially close to it. This enables the camera of the second channel to capture the image of the peripheral zone of the contact lens.

Method and apparatus for inspecting ophthalmic lens

An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than the first image area, such as a larger circle that is defined by the smaller circle of view as it rotates around the center point. The second end remains centered on the center point and provides a viewing area that does not change in dimension. An image data system at the second end of the rotating prism generates image data as the prism rotates so as to generate two or more sets of image data that are contained within the field of view area.

Growing community of inventors

Singapore, Singapore

Soon Wei Wong