Skhynix Inc.

Hynix Semiconductor Inc.

Soon Ok Seo

Seiichi Aritome

Sang Bum Lee

Se Jun Kim

Suk Kwang Park

Yeon Joo Jeong

A semiconductor device includes a plurality of memory blocks each including a plurality of memory cells, a circuit group performing a program operation, a read operation and an erase operation on a selected memory block, among the plurality of memory blocks, and a control circuit controlling the circuit group to program the memory cells of the selected memory block in a healing pattern. The healing pattern is programmed before a subsequent program operation is performed on the selected memory block. The memory cells of the healing pattern include erased memory cells and programmed memory cells arranged alternately.

Semiconductor device and method for programming healing patterns on memory blocks

A read method of a semiconductor memory device includes performing a read operation on target cells by using a first read voltage, terminating the read operation on the target cells if, as a result of the read operation on the target cells, error correction is feasible, performing a read operation on first cells next to the target cells along a first direction if, as a result of the read operation on the target cells, error correction is unfeasible, performing the read operation again on the target cells by selecting one of a plurality of read voltages in response to a result of the read operation on the first cells and by using the selected read voltage for reading data of the target cells, and terminating the read operation on the target cells if error correction is feasible.

Read methods of semiconductor memory device

A semiconductor memory device includes a plurality of memory blocks formed over a substrate including source regions and separated from each other by a slit, a plurality of bit lines coupled to the strings of the memory blocks and disposed over the memory blocks, and source contact lines formed within the slits, coupled to the source regions, respectively, and disposed in a direction to cross the plurality of bit lines.

Semiconductor memory device and method of manufacturing the same

A programming method of a nonvolatile memory device includes inputting even data and odd data to be programmed into even memory cells coupled to even bit lines and odd memory cells coupled to odd bit lines, respectively, setting a sense signal as a first sense signal or a second sense signal having a lower voltage level than the first sense signal, based on odd data of odd memory cells adjacent to each of the even memory cells to be programmed, programming the even data into the even memory cells by supplying a program voltage, performing a program verify operation on each of the even memory cells in response to the set sense signal, and programming the odd data into the odd memory cells by supplying a program voltage.

Nonvolatile memory device performing a program verification with sense signals based on program data of adjacent memory cells and program method thereof

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Gwangju, South Korea

Soon Ok Seo