Boe Technology Group Co., Ltd.

Hefei Xinsheng Optoelectronics Technology Co., Ltd.

Cspc Zhongqi Pharmaceutical Technology (shijiazhuang) Co., Ltd.

Chinese Academy of Sciences

Hefei Boe Display Technology Co., Ltd.

China University of Geosciences (beijing)

Tibet Julong Copper Co., Ltd.

Datang Mobile Communications Equipment Co., Ltd.

China Academy of Telecommunications Technology

Chinese Academy of Medical Sciences

Cspc Zhongqi Pharmaceutical Technology Co., Ltd.

Song Wu

Guanhua Du

Mei Gao

Yuanfeng Tong

Jieqiong Bao

Wei Li

Ping Chen

Xiaoming Zhang

Hewei Wang

Guodong Wu

Youye Zheng

Shijun Li

Jiancuo Luosang

Yan Qi

Shuai Ji

Xiaofang Dou

Haitao Hu

Chuanbing Wei

Qiong Ci

Xiaofeng Liu

Qingyun Yang

Yuehua Wang

Peng Liu

Ke Fei Wang

Xing Xing Wang

Lin Zhang

Hao Yu

Ke Wang

Junfeng Li

Chen Tang

Yang Lv

Qiong Yang

Haibo Zhu

Tiezhu Xu

Jianwei Yu

Jiangang Wei

Zhuoga Suolang

Ping Zhu

Lubang Cheng

Defu Shu

Lixiong Li

Linghua Hao

Kai Qu

Ying Chang

Zhihong Yang

Yue Yuan

Fugai Chen

Huapeng Sheng

Linshan Tian

Jinling Liao

Meixu Wang

Zhixin Zhang

Hongjun Cheng

Jianzhou Yi

Quansheng Shen

Mingming Mu

Hongmei Guang

Xing Wang

Lübang Cheng

A method for rapid prediction of porphyry copper mineralization potential based on spectral characteristics of tourmaline, includes collecting and collating data related to magma-fluid evolution, petrography and mineralogy of a porphyry copper deposit in a working area, systematically, distinguishing magmatic tourmaline from hydrothermal tourmaline in the working area, and further distinguishing phases and generations of the hydrothermal tourmaline; collecting hydrothermal tourmaline samples of the same phase and generation; performing short-wave infrared spectroscopy measurement on the collected hydrothermal tourmaline samples; extracting spectral characteristics of the Fe—OH wavelength and Mg—OH wavelength of the tourmaline samples based on The Spectral Geologist (TSG); and when the Fe—OH wavelength is less than 2245.75 nm, and the Mg—OH wavelength is greater than 2356.57 nm in the short-wave infrared spectrum of the samples, indicating that the porphyry copper deposit in an area where the samples are located has a great metallogenic potential.

Method for rapid prediction of potential of porphyry copper mineralization based on spectral characteristics of tourmaline

The present disclosure provides a method for determining an ore-forming environment of a porphyry deposit based on a tourmaline component, including the following steps: collecting a tourmaline-containing rock in the porphyry deposit to obtain a rock sample; performing pretreatment on the rock sample to obtain a treated sample; performing an in-situ tourmaline trace element test on the treated sample to obtain a test result; performing data processing and interpretation on the test result to obtain tourmaline trace element data; establishing a discrimination factor based on the tourmaline trace element data; and determining the ore-forming environment based on the discrimination factor. The present disclosure can quickly recognize a forming environment of a newly discovered porphyry deposit, thereby summarizing a rule and quickly giving guidance for a next prospecting direction.

Method for determining ore-forming environment of porphyry deposit based on tourmaline component

The present disclosure relates to a liquid crystal panel and a repairing method thereof, and a display device. The liquid crystal panel includes an array substrate and a filter substrate, and the repairing method includes: irradiating a pixel which is a bright spot of the liquid crystal panel with laser from one side of the array substrate away from the filter substrate, so that a portion of the array substrate located in the pixel is converted from a light transmitting area into a light shielding area.

Liquid crystal panel and repairing method using a laser thereof, and display device

A method for repairing the gate-line disconnection includes: determining a disconnected position of a gate line; determining two connecting elements that are closest to the disconnected position and are respectively located at two sides of the disconnected position along an extending direction of the gate line; selecting one or two sub-pixels electrically connected to the two connecting elements as repair sub-pixels, determining a common electrode line coupled to a common electrode of each repair sub-pixel as a selected common electrode line; forming a communication path between a front portion and a rear portion at the disconnected position to bypass the disconnected position, the communication path including at least the common electrode of each repair sub-pixel and a separate line segment cut from the selected common electrode line; disconnecting the common electrode in the communication path from other common electrodes; and disconnecting each repair sub-pixel from a data line.

Methods for repairing gate-line disconnection and short circuit between gate line and data gate and repair structure

A lighting jig and lighting method are disclosed. The lighting jig includes: a signal generator; a data signal circuit board connected with the signal generator, the data signal circuit board being configured to split the data signal and the scanning signal; at least one data signal probe piece connected with the data signal circuit board; and at least one scanning signal circuit board connected with the data signal circuit board, the scanning signal circuit board being connected with a scanning signal probe piece. The lighting jig improves the stability of signal loadings.

Lighting jig and lighting method

A probe assembly and a detecting device including the same, the probe assembly is configured to detect the display panel and includes a first probe region corresponding to leads of the display panel, wherein a location in the first probe region corresponding to a first lead among the leads connected in the display panel is provided with a probe, and a location in the first probe region corresponding to a lead adjacent to the first lead is not provided with a probe; wherein the first lead is any one of the leads which are connected. The detecting device comprises the probe assembly. It solves the problem that the currently known probe assembly may result in short-circuit between adjacent probes when used for display panel detection, avoids the condition where a detective display panel cannot be detected, improves the detection rate, ensures the image quality of the display panel, and hence avoids a waste of production material and reduces the production cost.

Probe assembly and detecting device comprising the same

According to the present disclosure, there is disclosed an array substrate, a liquid crystal display panel and a broken-line repairing method thereof. The array substrate comprises: signal lines, which includes a plurality of gate lines and a plurality of data lines intersecting with each other; and a plurality of pixel units defined by the gate lines and the data lines, wherein a thin film transistor, a common electrode and a pixel electrode, which is connected to a drain of the thin film transistor, are formed in each of the pixel units, for each of the pixel units, at the positions of two corners which are adjacent to one of the data lines, a first repair area and a second repair area are formed, respectively; within the first repair area and the second repair area, patterns of the pixel electrode and the data line overlap, and there is no pattern of the common electrode.

Array substrate, liquid crystal display panel and broken-line repairing method thereof

Embodiments of the present invention provide a display panel and a display device. The display panel comprises a first substrate and a second substrate which are disposed by cell-aligning, and light for displaying exits from the second substrate side. The display panel further comprises an optics element, the optics element being disposed at the light-emergent side of the second substrate to enable the light exiting from a light-emergent side of the second substrate to pass through the optics element and then cover a bezel area of the display panel. The display panel enables light exiting from a light-emergent side of a second substrate to pass through the optics element and then cover the bezel area of the display panel, by disposing the optics element, thereby enabling an image displayed by the display panel to cover the bezel area of the display panel and then achieving a non-bezel displaying.

Display panel and display device

The present disclosure provides a light-on detection device and a light-on detection method. The light-on detection device includes a substrate, and a probe block provided with probes and connected to the substrate. The light-on detection device further includes a flattening element configured to apply a force onto a surface of the display panel so as to change the surface of the display panel from a first shape having a first height difference to a second shape having a second height difference less than the first height difference, thereby to enable the probes to perform the light-on detection on the display panel with the second shape.

Light-on detection device and light-on detection method

Inclusion complexes of pinocembrin with cyclodextrin or its derivatives and their preparation are provided. The inclusion complexes can be used to make drugs.

Inclusion complexes of pinocembrin with cyclodextrin or its derivatives

The present invention provides a detecting apparatus and a detecting method. The detecting apparatus comprises: a base, a light source module, an image generating unit and a detecting unit. The light source module is configured to generate detecting light and cause the detecting light to irradiate towards the image generating unit after passing through an area of a shorting bar circuit in a panel. The image generating unit is configured to receive the detecting light irradiating thereon, and generate a detecting image of the area of the shorting bar circuit. The detecting unit is configured to detect whether the shorting bar circuit in the panel is cut off based on the detecting image. As the detecting light passing through the panel lasts for a longer time and is of higher brightness, the detecting image generated by the image generating unit is clearer.

Detecting apparatus and detecting method

A TN-type array substrate and a fabrication method thereof, and a display device, the fabrication method of the TN-type array substrate includes: a step of forming a first metal layer, a gate insulating layer, an active layer, a second metal layer and a transparent conductive layer on a substrate, wherein the first metal layer includes a gate electrode, the second metal layer includes a data line, the transparent conductive layer includes a pixel electrode; and wherein the forming the second metal layer and the transparent conductive layer includes: sequentially forming a transparent conductive thin film and a metal thin film on the substrate; performing one-off patterning process on the transparent conductive thin film and the metal thin film to form a thin film transistor (TFT) channel region, the transparent conductive layer and the second metal layer.

TN-type array substrate and fabrication method thereof, and display device

An array substrate, a method for repairing broken line of the array substrate, and a display device are provided. The array substrate comprises: a gate line () and a data line () intersecting with each other to define a plurality of pixel regions arranged in a matrix form; a thin film transistor () disposed in the vicinity of an intersection of the gate line () and the data line (), a gate electrode (') of the thin film transistor () being connected to the gate line (), and a source electrode of the thin film transistor () being connected to the data line (); a common electrode () and a pixel electrode () disposed in each pixel region. The common electrode () is provided with a plurality of patterns of strip hole structure () patterns respectively above each pixel region, the gate line (), the data line () and the common electrode () are fabricated on different layers and partially overlap each other, and the common electrode () is provided with a pattern of a first hole structure () at a corresponding position of the intersection of the gate line () and the data line ().

Array substrate, method for repairing broken line of the array substrate, and display device

An array substrate and a manufacturing method thereof and a display device are provided, wherein the array substrate includes: a substrate, and a gate electrode, a gate insulating layer, an active layer, a source electrode, a drain electrode and an insulating protection layer sequentially formed on the substrate, and the substrate is further provided with a pixel electrode and a common electrode, and a first leading wire hole connecting the pixel electrode with the drain electrode and a second leading wire hole connecting the common electrode with a common electrode line, the pixel electrode is provided on the substrate, and the gate electrode is directly provided on a transparent conductive layer which is provided at the same layer with the pixel electrode; the pixel electrode is connected with the drain electrode through a first metal connection layer provided in the first leading wire hole, and the first metal connection layer is provided at the same layer with the gate electrode.

Array substrate, manufacturing method thereof and display device

Embodiments of the present invention provide an array substrate, a manufacturing method thereof, and a display device. The array substrate comprises: a pixel region, a data-line pad region and a gate-line pad region; the pixel region comprises: a pixel electrode, a gate electrode of a TFT, source and drain electrodes of the TFT, a connection electrode, and a common electrode; the data-line pad region comprises: an insulating layer, a semiconductor layer, a data line, and a data-line connection pad; the data line and the source and drain electrodes are of a same layer and a same material; and the gate-line pad region comprises: a gate line, an insulating layer, and a gate-line connection pad; the gate line and the gate electrode are of a same layer and a same material; and the gate-line connection pad and the source and drain electrodes are of a same layer and a same material. The array substrate can reduce the number of masks and exposure times, thereby reducing manufacturing costs and improving production efficiency.

Array substrate, manufacturing method thereof, and display device

Growing community of inventors

Beijing, China

Song Wu