International Business Machines Corporation

Kla Corporation

Shanghai Ultimate Power Communications Technology Co., Ltd.

Song Qing Wu

Wen Wei Tang

Adam Lee Soderlund

Andrei V Shchegrov

Hai Jin

Yin Xu

Jonathan M Madsen

Lie-Quan Lee

Kun Wang

Pablo Rovira

Tianrong Zhan

Brian C Lin

Honglei Wang

Xian Liu

Jiqiang Li

Andrew Lagodzinski

Hang Huang

The present invention relates to a container-oriented Linux kernel virtualizing system, at least comprising: a virtual kernel constructing module, being configured to provide a virtual kernel customization template for a user to edit and customize a virtual kernel of a container, and generate the virtual kernel taking a form of a loadable kernel module based on the edited virtual kernel customization template; and a virtual kernel instance module, being configured to reconstruct and isolate a Linux kernel, and operate a virtual kernel instance in a separate address space in response to a kernel request from a corresponding container. The container-oriented Linux kernel virtualizing system of the present invention is based on the use of a loadable module.

Container-oriented Linux kernel virtualizing system and method thereof

Methods and systems for selecting measurement locations on a wafer for subsequent detailed measurements employed to characterize the entire wafer are described herein. High throughput measurements are performed at a relatively large number of measurement sites on a wafer. The measurement signals are transformed to a new mathematical basis and reduced to a significantly smaller dimension in the new basis. A set of representative measurement sites is selected based on analyzing variation of the high throughput measurement signals. In some embodiments, the spectra are subdivided into a set of different groups. The spectra are grouped together to minimize variance within each group. Furthermore, a die location is selected that is representative of the variance exhibited by the die in each group. A spectrum of a measurement site and corresponding wafer location is selected to correspond most closely to the center point of each cluster.

Methods and systems for selecting wafer locations to characterize cross-wafer variations based on high-throughput measurement signals

A metrology system is disclosed. In one embodiment, the metrology system includes a controller communicatively coupled to a reference metrology tool and an optical metrology tool, the controller including one or more processors configured to: generate a geometric model for determining a profile of a test HAR structure from metrology data from a reference metrology tool; generate a material model for determining one or more material parameters of a test HAR structure from metrology data from the optical metrology tool; form a composite model from the geometric model and the material model; measure at least one additional test HAR structure with the optical metrology tool; and determine a profile of the at least one additional test HAR structure based on the composite model and metrology data from the optical metrology tool associated with the at least one HAR test structure.

Loosely-coupled inspection and metrology system for high-volume production process monitoring

Restoring from a legacy OS environment to a Unified Extensible Firmware Interface (UEFI) pre-boot environment, including: storing, under the UEFI pre-boot environment, context in the UEFI pre-boot environment that needs to be preserved, where the context in the UEFI pre-boot environment that needs to be preserved includes CPU execution context; restoring a first portion of the CPU execution context in response to the UEFI pre-boot environment failing to load the legacy OS; making a CPU associated with the UEFI pre-boot environment enter into System Management Mode, and restoring a second portion of the CPU execution context under the System Management Mode; and exiting from CPU System Management Mode, thereby returning to the UEFI pre-boot environment.

Restoring from a legacy OS environment to a UEFI pre-boot environment

A technique for receiving multi-frequency data in a high speed downlink access service is disclosed. In this manner, one or more deficiencies of current HSDPA technology are mitigated, such as where user equipment (UE) can merely be scheduled by the network side at a single frequency. Among other things, a control channel set and a list of frequencies for user equipment (UE) are exchanged between a network side and UE accessing the network.

Receiving multi-frequency data in high speed downlink packet access service

Growing community of inventors

Shanghai, China

Song Qing Wu