Mitsubishi Denki Kabushiki Kaisha

Soichiro Okuda

Yoshihiro Ueda

Hiroyuki Sasao

Hajimu Yoshiyasu

Shigeo Sasaki

Takashi Hashimoto

Kenji Kimura

Yoshinori Ishii

Takayoshi Nagai

Takeo Saikatsu

Shinji Tanabe

Kazunori Ikegami

Tetsuya Nakanishi

Kazuo Yoshida

Kazuhiko Noguchi

Hisao Nakanishi

Hisakazu Yamane

Masayuki Toshiyasu

Yoshio Yamane

Keiji Yanai

Ritsuo Ishida

Koji Ishibata

Fumiharu Yabunaka

A 3-electrode, surface-discharge type plasma display is capable of offsetting a radiation fields which is generated at the time of displaying, to reduce radiation noises. To drive the plasma display, an X-electrode and a Y-electrode are separated to an even number (2m) and an odd number (2m-1), respectively. During a resetting period and an addressing period, pulse voltage is applied to the even-numbered and odd-numbered electrodes at the same time, whereas in a sustained discharge period, the phase of the pulse voltage applied to the even-numbered electrode is delayed by 180 degrees from that applied to the odd-numbered electrode.

Plasma display

An ion implantation apparatus comprises an ion beam measuring device to measure and analyze the shape of a beam projected on a substrate for ion implantation and the quantity of current obtained by the ion beam, an analyzing slit member having an opening whose width is changeable, which is located in the ion beam track to extract only implantation ions, and a shaping slit member having an opening whose width is changeable, which is located behind the analyzing slit member to determine the shape of the beam to be projected on the substrate for ion implantation, wherein the widths of the openings of the analyzing slit member and the shaping slit member are changed on the basis of the shape of the beam and the quantity of current obtained as a result of the measurement by the ion beam measuring device.

Ion implantation apparatus

A charged-particle distribution measuring apparatus includes a particle passing member having a plurality of through-holes through which portions of a beam of charged particles can pass, a particle trapping member for trapping charged particles that have passed through the through-holes, a recoil particle trapping member disposed between the particle passing member and the particle trapping member, and a mechanism for moving the members to measure the spatial distribution of the charged particle beam. Preferably, the through-holes in the particle passing member are uniformly distributed in a checkerboard pattern. The movement of the members permits measurement of the currents produced by the charged particle beam at various intervals between the locations of the through-holes at the beginning of the measurement. The measurement of the charged particle beam intensity at positions across through the beam, rather than at fixed locations within the beam, improves the resolution of the measured distribution. The apparatus can be employed with positively and negatively charged beams and is useful in ion implantation.

Charged-particle distribution measuring apparatus

A cathode ray tube apparatus comprises three cathodes arranged in line with each other in a first direction for emission of respective electron beams therefrom, a focusing electrode having first to third apertures defined therein for the passage of the respective electron beams therethrough, a quadrupole electrode structure including first to third quadrupole electrodes one for each electron beam, each of the quadrupole electrode being comprised of a pair of horizontal electrode pieces spaced a predetermined distance from each other in a second direction perpendicular to the first direction and positioned upwardly and downwardly, respectively, with respect to the associated electron beam, and a pair of vertical electrode pieces spaced a predetermined distance from each other in a direction aligned with the first direction and positioned leftwards and rightwards with respect to such associated electron beam, and a power source circuit for applying a predetermined voltage to the quadrupole electrode structure.

Cathode ray tube apparatus with quadrupole electrode structure

A hollow cylindrical member includes a compression chamber and a reservoir partitioned by a circumferential step disposed on its inner wall surface and filled with an arc-extinguishing fluid. A piston loaded with a spring forms stationary contact and is slidably fitted into the compression chamber while the reservoir is connected to the exterior of the cylindrical member through a flared hole in an electrically insulating nozzle. A movable contact loosely extends through the nozzle to engage separably the piston. The stationary contact may be disposed in the reservoir while the piston serves as an arc contact. The spring may be replaced by a tulip-shaped member on the piston forced into a recess on the free end of the movable contact and leaving it upon the piston engaging the step.

Self-extinguishing switch

A switch comprises an envelope including a pressure increasing compartment filled with an arc extinguishing fluid. A slit extends through one longitudinal side of the envelope to communicate with the compartment. A movable contact member having a flat cross section normally extends through the slit to block substantially the slit until the movable member engages a stationary contact member outside of the slit. The arc extinguishing fluid increases in pressure in response to heat of an electric arc established across the separated contact member and delivered through the slit to be perpendicular to the arc axis.

Arc self-extinguishing switch device

An outer arc extinguishing compartment is disposed coaxially with an inner arc extinguishing compartment and partly projects under one end thereof. A movable contact member extends through both compartments and separably engages a stationary contact member located within the inner compartment. A plurality of arc suppressors of spindle-shaped cross section are disposed at equal angular intervals in the projecting portion of the outer compartment adjacent to and about the movable contact member to extend axially and radially of the latter. The circumferential minimum distance between the arc suppressors is smaller than the diameter of a positive column of an electric arc struck across both contact members.

Switching device

Growing community of inventors

Amagasaki, Japan

Soichiro Okuda