Nippon Telegraph and Telephone Corporation

Ntt Corporation

Soichi Oka

Masahiro Ueno

Takashi Sakamoto

Sohan Kawamura

Yuichi Akage

Takashi Miwa

Azusa Ishii

Masamitsu Watanabe

Tadayuki Imai

Shota Oki

Shingo Mineta

Mamoru Mizunuma

Yurina Tanaka

Tadashi Minotani

Yosuke Takeuchi

Eri Matsunaga

Takashi Sawada

Takuya Kamisho

Shoji Mochizuki

Shiori Konisho

Masanari Shoji

Takuya Otsuka

Yasuhiro Higashi

Kenichi Tanigaki

An optical deflector which includes a dielectric having a paraelectric phase and a trap for storing an electric charge therein and deflects light transmitted through the dielectric by applying a voltage in a direction perpendicular to a transmission direction of the dielectric is provided. The optical deflector includes a first conductor, the dielectric, a second conductor, and two insulators in contact with both side surfaces parallel to a voltage application direction of the dielectric between the first conductor and the second conductor in this order, wherein a voltage is applied between the first conductor and the second conductor, a temperature of the first conductor and the second conductor is controlled independently, and one of the side surfaces of the dielectric is irradiated with excitation light through one insulator.

Optical deflector

A first component having a plate shape includes a first incident surface and a first emission surface disposed on the opposite side of the first incident surface. The first component is made of light transmissive material having an electrostrictive effect. The first component further includes a first transparent electrode formed on the first incident surface, and a second transparent electrode formed between the first emission surface and a first reflective film.

Wavelength variable optical filter

An optical deflector has a dielectric of a paraelectric phase and deflects light transmitted through the dielectric by applying a voltage in a direction perpendicular to a transmission direction of the dielectric, the optical deflector including, in order, a first temperature control element, a first conductor on which a first sensor is disposed, the dielectric, a second conductor on which a second sensor is disposed, and a second temperature control element, wherein a voltage is applied between the first conductor and the second conductor, the dielectric is irradiated with excitation light having a substantially uniform intensity in an application direction of the voltage, and a temperature of the first conductor and a temperature of the second conductor are set to predetermined temperatures.

Optical deflector and method for determining control condition of optical deflector

An electro-optical device includes an electro-optic crystal, a first electrode, and a second electrode. A voltage is applied to the electro-optic crystal by the first electrode and the second electrode. The electro-optic crystal has an incident surface and an emitting surface parallel to each other and deflects incident light made incident on the incident surface at an acute incident angle in an electric field direction in which a voltage is applied. A rotation axis of an incident angle is parallel to the electric field direction.

Electro-optical device

An angle measurement device according to the present invention relates to an angle measurement device for measuring an incident angle of an incident light ray, and includes: at least one light deflector; a driving power supply; a light receiver; and a calculation unit. The light deflector is of a transmission type, has an electro-optic effect, and is configured to change an optical path of the light ray by a voltage applied from the driving power supply, and cause the light ray to enter the light receiver. The calculation unit is configured to calculate the incident angle based on the voltage at which an intensity of the light ray detected by the light receiver is maximum.

Angle measurement device and method

A first chromatogram is obtained by analyzing a second standard sample by size exclusion chromatography analysis using a first detector. Also, a second chromatogram is obtained by analyzing a solvent for the second standard sample by size exclusion chromatography analysis using the first detector. Then, from the difference between the first chromatogram and the second chromatogram, a third elution time in size exclusion chromatography analysis of the second standard sample using the first detector is determined.

Analysis method

An optical deflection apparatus is provided with an optical deflection element and a compensating optical element. The optical deflection element deflects incident light in a first direction (a voltage application direction) in which a voltage is applied (one-dimensional scan). The compensating optical element is an element which has an incidence surface and an emission surface, which compensates for a deflection deviation in a second direction that is perpendicular to the first direction and to an optical axis of the incident light of deflected light having been deflected by the optical deflection element and incident from the incidence surface, and which arranges a direction of travel of compensated light to be emitted from the emission surface on a same plane.

Optical deflection device

A soil parameter required when civil engineering/mechanical simulations for various grounds are performed is appropriately determined. A parameter determination device determines a parameter of a particle model used in a ground analysis system. The parameter determination device includes a triaxial compression test numerical analysis unit configured to determine the parameter so that the adhesive force and the shear resistance angle of a virtual ground respectively match the adhesive force and the shear resistance angle of an actual ground with a predetermined accuracy, and a pull-out test numerical analysis unit configured to determine the parameter so that a ground reaction force coefficient of the virtual ground matches a ground reaction force coefficient of the actual ground with a predetermined accuracy.

Parameter determining device, parameter determining method, and parameter determining program

A zinc spraying material comprises a zinc material containing zinc; and a sulfate salt whose solubility in water is ⅛ or more of the solubility of calcium sulfate. The content of the sulfate salt in the zinc spraying material can be 0.006 to 0.14 mol based on 100 g of the content of the zinc material. Note that the sulfate salt can be at least one of potassium sulfate, sodium sulfate, magnesium sulfate, calcium sulfate, ferric sulfate, ferrous sulfate, lithium sulfate, calcium sulfate, and aluminum sulfate. Also, the zinc material is zinc. Alternatively, the zinc material can also be a zinc alloy containing zinc as the main component and at least one metal selected from aluminum and magnesium.

Zinc tharmal splaying material and method for manufacturing the same and tharmal splaying device

A corrosion amount estimation apparatus includes a soil analysis unit adapted to acquire a particle diameter distribution in soil in each of plural soil samples; a corrosion measurement unit adapted to take electrochemical measurements at plural soil moisture percentage values on an electrode containing the metallic material buried in each of the soil samples; a soil classification unit adapted to classify the soil in each of the soil samples; a corrosion rate calculation unit adapted to calculate a corrosion rate regarding each of the soil samples at each of the soil moisture percentage values and identify a local maximum corrosion rate; a corrosion estimation curve generation unit adapted to generate a corrosion estimation curve; and a corrosion amount estimation unit adapted to acquire the class proportions of actual soil in which the metallic material is buried, acquire the local maximum corrosion rate corresponding to the class proportions from the corrosion estimation curve, and estimate the corrosion amount of the metallic material.

Corrosion amount estimation device and corrosion amount estimation method

A laser light scanning apparatus includes: an optical system that generates parallel light from laser light emitted from a light source; an optical deflector that performs one-dimensional deflection on the parallel light from the optical system; and a diffractive optical element that diffracts deflected light from the optical deflector. The diffractive optical element is configured such that the diffracted light is focused along a predetermined axis that extends from the optical deflector toward the diffractive optical element, and the position at which the diffracted light is focused on the predetermined axis changes according to the incidence position of the deflected light.

Laser light scanning device and laser light scanning method

In an embodiment, an optical deflection device includes: an electro-optic crystal comprising KTaNbO, the electro-optic crystal having a first surface and a second surface, the first surface and the second surface facing each other; a first electrode on the first surface of the electro-optic crystal; a second electrode on the second surface of the electro-optic crystal; a power source configured to output a control voltage for forming an electric field inside the electro-optic crystal via the first electrode and the second electrode; and a light source configured to emit a pulse laser to be incident on the electro-optic crystal along an optical axis, the optical axis substantially perpendicular to a direction of the electric field formed by the control voltage, wherein a peak power density of the pulse laser output from the light source at a light incidence surface of the electro-optic crystal is less than 800000 W/cm.

The present invention includes an optical deflector that changes a deflection angle depending on an applied voltage, a voltage control unit that applies a voltage to the optical deflector, and a storage unit that stores a value of a voltage to be output by the voltage control unit. The voltage control unit outputs a voltage of a value stored in the storage unit to the optical deflector. The storage unit stores a goal voltage V=g(t), which provides a deflection angle θ with the goal time dependency θ=θ(t).

Control method of optical deflector, and optical deflection device

On an optical path of a condensing lens (), a varifocal lens () is disposed. The varifocal lens () is formed of an electro-optic crystal such as, e.g., potassium tantalate niobate. A condensation position measurement unit () measures a condensation position where laser light is condensed by the condensing lens (). A condensation position control unit () controls a focal position of the varifocal lens () such that a difference between the condensation position measured by the condensation position measurement unit () and a prescribed condensation position that has been set falls within an acceptable range.

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Tokyo, Japan

Soichi Oka