Kabushiki Kaisha Toshiba

Nippon Hoso' Kyokai

Sohei Manabe

Yoshiyuki Matsunaga

Nozomu Harada

Katsuhiro Gonpei

Takao Kuwahata

Yukio Endo

Mamoru Iesaka

Yasuaki Nishida

Masatoki Nakabayashi

A solid state image sensor comprises a CCD type image sensing device and a signal detector. This signal detector comprises an FDA type signal detection circuit connected to a signal pick-up terminal of the image sensing device and having a small amount of saturating signals and low noise, an FDA type signal detection circuit connected to the signal pick-up terminal and having a large amount of saturating signals and high noise, and a signal composing circuit for composing the outputs of both signal detection circuits and outputting a composed output and changing a composing ratio in accordance with the output of the FDA type signal detection circuit.

Solid state image sensor having low and high level signal component

A solid image pickup apparatus comprises a plurality of photo sensing elements, arranged on a semiconductor substrate two-dimensionally and spaced mutually by specified distances, for outputting electric charges on receiving light, a semiconductor channel formed among the photo sensing elements and transferring electric charges output from the photo sensing elements. The semiconductor channel comprises cross-shaped channel members, each channel member being located inside four photo sensing elements. A plurality of vertical transfer electrodes, are provided on the channel members, for giving electric potential to the channel members and having electric charges transferred to the channel members of the next stages. Each of the channel members comprises a wide-width part and a narrow-width part located between the wide-width part and the channel member of the next stage. The narrow-width part is formed by an ion-implanting method to have a higher impurity concentration than that of the wide-width part.

Solid image pickup apparatus

In a CCD image sensor, a plurality of horizontal CCD registers are disposed adjacent to an image sensing area having matrix-arrayed image sensing cells and a plurality of vertical CCD registers. In the CCD image sensor, the channel impurity concentration of second horizontal CCD register, located away from the image sensing area, is more higher than that of first horizontal CCD register. With this feature, when the charges are transferred to the second horizontal CCD register across the first horizontal register, the residual charges in the first horiozntal CCD register are remarkably reduced.

Low noise CCD image sensor having a plurality of horizontal CCD registers

A photoconductive target of an image pickup tube consists of a transparent substrate, a transparent conductor formed thereon, a photoconductive layer, containing Cd, Te and Se and formed on the conductive layer, and a high resistance layer formed on the photoconductive layer. The Molar ratios of Cd, Te and Se contained in the photoconductive layer satisfy a general formula CdTe.sub.1-x Se.sub.x where x falls within the range between 0.3 and 0.5.

Photoconductive target of image pickup tube

Disclosed is a photoconductive target of an image pickup tube having a transparent substrate, a transparent conductive layer formed on the transparent substrate, a photoconductive layer formed on the transparent conductive layer and containing cadmium, tellurium and selenium as major components, and a high resistance layer formed on the photoconductive layer. The film thickness of the photoconductive layer is more than 1,000 .ANG. and less than 10,000 .ANG. and the film thickness of the high resistance layer falls within the range between 2 and 10 .mu.m.

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Yokohama, Japan

Sohei Manabe