Nxp B.v.

Sofiane Ellouz

Herve Marie

Christophe Kelma

An analysis circuit for analysing the RF response of an RF circuit, includes a voltage controlled oscillator (), wherein a signal derived from voltage controlled oscillator output is applied as input to the RF circuit (). A first mixer () mixes the RF circuit output with a first mixer signal derived from the voltage controlled oscillator and a second mixer () mixes the RF circuit unit output with a second mixer signal derived from the voltage controlled oscillator, the first and second mixer signals being 90 degrees out of phase. The mixer output signals are processed to provide the analysis. This analysis circuit uses mixers to enable baseband digital signal processing of signals to enable a frequency response characteristic of the RF circuit to be obtained. The analysis circuit essentially operates in the manner of an IF demodulator circuit.

RF circuit analysis

A wafer comprises i) at least one independent die having internal integrated components, a multiplicity of internal pads connected to some of the internal integrated components, ii) scribe lanes defined between and around each independent die, and in part of which are defined, for each die, at least a first group of external pads and/or a second group of external test integrated components. The external pads of each first group are connected, through conductive tracks, to a chosen one of the internal pads and/or internal integrated components of the associated die, and arranged to be fed with chosen test signals or to collect test result signals. Each external test integrated components of each second group is connected, through conductive tracks, to a chosen one of the die internal pads and/or die internal integrated components and/or to external pads of a first group.

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Caen, France

Sofiane Ellouz