Samsung Electronics Co., Ltd.

So-Hee Hwang

Jeong-Un Choi

An e-fuse adapted to indicate programming state in relation leakage current path defined by a program transistor both before and after dielectric breakdown has occurred. The e-fuse comprises: a program circuit including the program transistor, a switch circuit connected between the program circuit and ground, a current supply circuit connected to the program circuit and supplying a predetermined current to the leakage current path after the program transistor is programmed; and a sense/amplification circuit connected to a program node associated with the leakage current path and adapted to sense and output the programming state.

Growing community of inventors

Suwon-si, South Korea

So-Hee Hwang