Nortek Security & Control LLC

Sivakumar Kathan

Frank Raymond Nichols, Sr

Dustin Cameron Mitchell

Stephen McClure

A method for calibrating a device is described. The device accesses magnetometer data of a magnetometer sensor in the device, and accelerometer data of an accelerometer sensor in the device. The device determines a first position and a second position of the device based on the magnetometer data and the accelerometer data. The device determines a first magnetic vector based on the magnetometer data at the first position of the device, and a second magnetic vector based on the magnetometer data at the second position of the device. The device then assigns the first magnetic vector to the first position of the device, and the second magnetic vector to the second position of the device.

Automatic calibration of contact sensor

A magnetometer sensor that detects tampering is described. The sensor samples magnetometer data and computes a set of vectors based on the magnetometer data. The sensor detects a tampering of the magnetic sensor based on determining that the set of vectors is outside the reference plane for the magnetometer sensor. The sensor generates a notification to a security system coupled to the magnetometer sensor. The notification indicating the tampering of the magnetometer sensor.

Vector magnetic tamper detection for sensors

An adjustable security sensor device is described. The device comprises a time of flight sensor, a user input element, and a processor. The time of flight sensor generates a first set of sample distance measurements based on a first position of the time of flight sensor relative to the reflector, in response to receiving the identification of the first position of the device relative to the reflector. The processor associates the identification of the first position with the first set of sample distance measurements. A second set of sample distance measurements is measured based on a second position of the time of flight sensor relative to the reflector. The processor compares a first range of the first set of sample distance measurements with a second range of the second set of sample distance measurements, and identifies a position of the device relative to the reflector based on the comparison.

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Oceanside, CA, United States of America

Sivakumar Kathan