Sandisk Technologies Inc.

Sivakumar Grandhi

Sridhar Yadala

Pradeep Anantula

Venkata Nittala

Nittala Venkata Satya Somanadh Kumar

Aswani Krishna Lakshminarayana Addagalla

VSNKChaitanya G

A method for trimming analog temperature sensors. First, raise a temperature of a temperature sensor to a highest temperature of a qualification temperature range. Then, trim the temperature sensor such that a high temperature code generated by the temperature sensor represents an actual temperature reported by the temperature sensor at the highest temperature. Next, lower the temperature of the temperature sensor to a lowest temperature of the qualification temperature range. Determine a slope error between the high temperature code and a low temperature code generated by the temperature sensor at the lowest temperature. Finally, determine a correction function that compensates for the slope error of measured temperature codes generated by the temperature sensor for temperatures across the qualification temperature range.

Apparatus, system, and method for trimming analog temperature sensors

An apparatus and method for detecting leakage current in a non-volatile memory array. A reference current is connected to a leakage detection circuit. A reference code is determined for the leakage detection circuit coupled to a switching circuit. The reference code establishes a leakage current threshold. The reference current is disconnected from the leakage detection circuit and the switching circuit. Next, the leakage detection circuit is connected to a set of word lines of a storage block of a non-volatile memory array by way of the switching circuit. A memory current is generated within the set of word lines. A leakage code is determined for the set of word lines representing leakage current from the word lines in response to the memory current. The leakage code is compared with the reference code. If the leakage code exceeds the reference code, the storage block is deemed unusable.

Non-volatile memory array leakage detection

A bandgap reference generation circuit in an integrated circuit (IC) and method for generating a bandgap reference voltage are disclosed. The bandgap reference generation circuit includes a first proportional to absolute temperature (PTAT) current generation section for generating a PTAT current component, a current circuit configured to generate a trimmed PTAT current component substantially invariant of sheet resistance of at least one resistor in the current circuit, and a complementary to absolute temperature (CTAT) current generation section including a diode on which the trimmed PTAT current component is fed to generate a CTAT current component. A combination of the PTAT and CTAT current components generate the bandgap reference voltage.

Growing community of inventors

Bengaluru, India

Sivakumar Grandhi