Fujitsu Technology Solutions Gmbh

Fujitsu Germany Gmbh

Simran Agarwal

Leslie Casas

Markus Bößl

Shweta Mahajan

Jochen Riedisser

Keng Chai

Felix Rothmund

Jonathan Pirnay

A method of analyzing a product includes performing an anomaly detection on a received image using an autoencoder, wherein the autoencoder includes at least one first neural network trained based on a first set of training images, and the first set of training images includes a plurality of training images each showing a corresponding defect-free product; determining, using a binary classifier, whether or not a defect is present based on a result of the anomaly detection; performing defect detection on the received image using a defect detector, wherein the defect detector includes a third neural network trained based on a one third set of training images, and the third set of training images includes a plurality of training images each showing a corresponding defective product; and evaluating a result based on a weighting of the results of the anomaly detection, the defect detection, and the binary classifier.

Method and apparatus for analyzing a product, training method, system, computer program, and computer-readable storage medium

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Munich, Germany

Simran Agarwal