Allegro Microsystems, LLC

Simon Rock

Loïc André Messier

Yannick Vuillermet

Andreas P Friedrich

Alexander Latham

Maxwell McNally

Shixi Louis Liu

Till-Jonas Ostermann

Shaun D Milano

Robert A Briano

Georges El Bacha

Thomas Kerdraon

Dominik Geisler

Evan Shorman

Emil Pavlov

Fabian Winkler

An apparatus, including: one or more first conductive layers; a plurality of second conductive layers that are electrically coupled to the first conductive layers, the first conductive layers and the second conductive layers being arranged to form a conductor, the first conductive layers being arranged to define a rift in the conductor, the rift being formed by using a plurality of through-holes that are situated above or below each other, each of the plurality of through-holes being formed in a different one of the second conductive layers, each of the plurality of through-holes being formed directly above or below a solid portion of at least one of the first conductive layers; and a dielectric material that is arranged to encapsulate, at least in part, the first conductive layers and the second conductive layers.

Current sensor system

A current sensor IC includes a lead frame having a die attach pad and elongated leads extending in a single direction with respect to the die attach pad, a semiconductor die having a first surface attached to the die attach pad and a second, opposing surface supporting magnetic field sensing elements, and a non-conductive mold material. A first portion of the mold material encloses the semiconductor die and the die attach pad, a second portion of the mold material encloses a portion of the elongated leads, and the mold material further includes a wing structure between the first portion and the second portion. In assembly, the first portion of the mold material extends into a cutout through a current conductor and the wing structure abuts a surface of the conductor. The current sensor can implement differential sensing based on signals from at least two magnetic field sensing elements.

Sensor package and system

Auto-calibrating current sensor integrated circuits (ICs) are configured for mounting at a position relative to a conductor. The auto-calibrating current sensor ICs can include a plurality of magnetic field sensing elements disposed at different locations within the integrated circuit, respectively, and can be configured to measure a magnetic field produced by a current carried by the conductor. The auto-calibrating sensors can include an electromagnetic model of the IC and the conductor. The model can be operative to determine a magnetic field at points in space due to a given current in the conductor at a known location of the conductor from the IC, and also the inverse situation of determining an unknown current and/or location of the conductor based on measurements of a magnetic field at known locations in space due to an unknown current in the conductor. Related auto-calibration methods are also described.

Auto-calibration for coreless current sensors

A system, comprising a bus bar having a first through-hole formed therein and a first current sensor that is disposed adjacent to the first branch. The first through-hole is arranged to define, at least in part, a first branch of the bus bar and a second branch of the bus bar. The first branch has different length and/or thickness than the second branch. The first current sensor is arranged to measure an electrical current through the bus bar.

Multiple branch bus bar for coreless current sensing application

A substrate, comprising one or more first conductive layers, one or more second conductive layers, and a dielectric material that is arranged to encapsulate, at least in part, the first conductive layers and the second conductive layers. The one or more second conductive layers are electrically coupled to the first conductive layers. The first conductive layers and the second conductive layers are arranged to form a conductor. The first conductive layers are arranged to define a first rift in the conductor.

Current sensor packages are described including a leadframe configured to carry a current to be sensed and a current sensor that is electrically isolated from the leadframe. The current sensor is disposed adjacent to a first portion of the leadframe that includes a plurality of notches. An encapsulating material is configured to encapsulate the current sensor and at least a part of the first portion of the leadframe that is adjacent to the current sensor and includes the plurality of notches. The current sensor includes a substrate, a first magnetic field sensing element that is formed on the substrate, and a second magnetic field sensing element that is formed on the substrate. The first magnetic field sensing element and the second magnetic field sensing element are disposed on opposite sides of a central axis of the first portion of the leadframe.

Current sensor package

A packaged current sensor integrated circuit includes a primary conductor having an input portion and an output portion configured to carry a current to be measured by a magnetic sensing element supported by a semiconductor die adjacent to the primary conductor. Each of the input portion and output portion of the primary conductor is exposed from orthogonal sides of the package body. A fault signal may be provided to indicate an overcurrent condition in the integrated current sensor package. The primary current path may be made of a thick lead frame material to reduce the primary current path resistance.

Packaged current sensor integrated circuit

Methods and apparatus for a magnetic field sensor having first and second arrays of magnetic field sensing elements with at least first and second orthogonal axes of sensitivity. The first array of magnetic field sensing elements is spaced a first distance from the second array of magnetic field sensing elements. A turns counter counts a number of times a magnetic pole pair of a moving target passes the magnetic field sensing elements with a selected pole pair resolution and a module determines absolute angular position of the target from differential signals from the first and second arrays of magnetic field sensing elements and the turns counter. The first distance is configured to match a pitch of the poles of the target.

Angle sensor

In one aspect, an angle sensor includes a first Hall element disposed on a first axis, a second Hall element disposed on a second axis perpendicular to the first axis and a conduction path having a first portion extending parallel to the first axis and a second portion parallel to the second axis. The conduction path is configured to conduct a calibration current that generates a first magnetic flux density measured at the first Hall element and a second magnetic flux density measured at the second Hall element. The angle sensor also includes calibration circuitry configured to generate one or more compensation signals based on the first and second magnetic flux densities and to adjust an external magnetic flux density measured at the second Hall element due to an external magnetic field using the one or more compensation signals to reduce angle error of the angle sensor.

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Heidelberg, Germany

Simon Rock