Siemens Aktiengesellschaft

Siemens Medical Instruments Pte. Ltd.

Sivantos Pte. Ltd.

Siemens Ltd., China

Simon Hüttinger

Jie Zhang

Tom Weidner

Matthias Fröhlich

Thomas Komma

Robert Bäuml

Frank Koch

Kai Kriegel

Bernd Tessendorf

Jürgen Rackles

Gernot Spiegelberg

Mattias Lampe

A method and a circuit functionally test a semiconductor component. The functional test is performed with galvanic isolation by using a transformer. The test itself is based on determining the frequency-dependent impedance of a series circuit of capacitors and inductors using the semiconductor component itself. The impedance is strongly influenced by the conduction state of the semiconductor component, in other words, by the instantaneous conductivity or blocking capability of the semiconductor component.

Galvanically isolated functional test for components

A configuration and an associated method for the wireless transmission of data between hearing devices include an external unit which generates and emits a carrier signal, a first hearing device with a first transponder which modulates and back-scatters the carrier signal and a second hearing device with a second transponder which receives the carrier signal that is scattered backwards and forwards and modulated by the first transponder. The external unit is, for instance, a hearing device remote control. Advantageously, little or no additional energy is needed in the hearing device for the wireless data transmission. The energy for the supply of the first transponder is delivered by the carrier signal of the external unit.

Configuration and method for wireless data transmission between hearing devices

Growing community of inventors

Erlangen, Germany

Simon Hüttinger