Teraview Limited

Simon Chandler

Bryan Edward Cole

Darius M Sullivan

Darius Sullivan

A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

Test system with adjustable delay line and radiation feedback control

Test system

Test system for testing the integrity of an electronic device

A probe array () for an imaging system for examining an object () comprising at least one emitter () for emitting radiation, a plurality of detectors () for detecting radiation and means for directing radiation emitted by the at least one emitter () to the object () and for directing radiation reflected from the object () to at least two of the plurality of detectors () wherein in use the emitted radiation is scanned by means () across the object ().

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Cambridge, United Kingdom

Simon Chandler