Samsung Corning Precision Materials Co., Ltd.

Corning Precision Materials Co., Ltd.

Siho Seong

Taeho Keem

Misun Kim

Hyun Woo Kim

YoungJoong Kim

Taekmin Kwon

An apparatus for inspecting an edge portion of a substrate can inspect a defect or a chamfered width on an edge portion of a substrate. First and second right-angled prisms are disposed above and below the edge portion such that inclined surfaces thereof are directed toward the upper surface and lower surface of the edge portion. A lighting part irradiates the edge portion of the substrate with light. A photographing part is disposed adjacent to the edge portion. The photographing part takes an image of the upper surface of the edge portion from light that has passed through the first right-angled prism, an image of the lower surface of the edge portion from light that has passed through the second right-angled prism, and an image of an end surface of the edge portion.

Apparatus for inspecting edge of substrate

An apparatus for measuring the transmittance of a piece of cover glass for a photovoltaic cell which can measure an accurate transmittance irrespective of whether or not the cover glass has a pattern and irrespective of the shape of the pattern. The apparatus includes a light source part disposed in front of the piece of cover glass. The light source part directs light into the piece of cover glass. A detector is disposed in the rear of the piece of cover glass, and detects light that has been directed into the piece of cover glass and then has passed through the piece of cover glass. The detector is disposed within a range where the intensity of the light that has passed through the piece of cover glass is uniform.

Apparatus for measuring transmittance of cover glass for photovoltaic cell

An apparatus for detecting a foreign substance on an interleaving paper to be inserted between glass substrates, in which the process of detecting the foreign substance on the paper is automated to improve the detection efficiency. The apparatus includes a paper-loading unit and a paper-inspecting unit configured to be connected to the paper-loading unit. The paper-inspecting unit detects a foreign substance on a surface of the paper loaded by the paper-loading unit. The apparatus also includes a paper-unloading unit, which is configured to be connected to the paper-inspecting unit, and unloads the paper from the paper-inspecting unit and then stacks the paper. The apparatus also includes a controller, which controls the paper-loading unit, the paper-inspecting unit and the paper-unloading unit to transfer the paper, and controls the paper-inspecting unit to detect the foreign substance.

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Chungcheongnam-do, South Korea

Siho Seong