Applied Microsystems Corporation

Sidney R Maxwell

A method and apparatus for producing a plurality of unique instrumentation tags for testing and debugging a computer program. The tags have a value equal to the combination of an offset and a base. The value for a tag offset is first determined. The tag is then inserted into an area of interest within the source code being instrumented. The base value is set when the object code for the computer program is linked to form executable code. The base value is resolved such that each tag has a unique value in comparison with any other tag. The source code being instrumented with tagging statements can reside on more than one computer. Moreover, the instrumented source code can be compiled on more than one computer. The unique value associated with each tagging statement is recorded in an instrumentation database, which facilitates observation of the instrumented program during its execution.

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Bothell, WA, United States of America

Sidney R Maxwell