Growing community of inventors

Palo Alto, CA, United States of America

Sidney E Buttrill

Average Co-Inventor Count = 1.39

ph-index = 9

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 253

Sidney E ButtrillJohn Daniel DeBord (2 patents)Sidney E ButtrillLiulin Deng (2 patents)Sidney E ButtrillAlexander Mordehai (2 patents)Sidney E ButtrillAlex V Mordehai (2 patents)Sidney E ButtrillChristopher Hank Becker (1 patent)Sidney E ButtrillSteven E Young (1 patent)Sidney E ButtrillKeith T Gillen (1 patent)Sidney E ButtrillSidney E Buttrill (16 patents)John Daniel DeBordJohn Daniel DeBord (11 patents)Liulin DengLiulin Deng (8 patents)Alexander MordehaiAlexander Mordehai (3 patents)Alex V MordehaiAlex V Mordehai (3 patents)Christopher Hank BeckerChristopher Hank Becker (20 patents)Steven E YoungSteven E Young (2 patents)Keith T GillenKeith T Gillen (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Varian Associates, Inc. (6 from 777 patents)

2. Ciphergen Biosystems, Inc. (3 from 35 patents)

3. Sri International (2 from 1,322 patents)

4. Mobilion Systems, Inc. (2 from 12 patents)

5. Other (1 from 832,680 patents)

6. US Government As Represented by the Secretary of the Army (1 from 8,684 patents)

7. Virgin Islands Microsystems, Inc. (1 from 41 patents)


16 patents:

1. 12163920 - Systems and methods for two-dimensional mobility based filtering of ions

2. 11662333 - Systems and methods for two-dimensional mobility based filtering of ions

3. 7791053 - Depressed anode with plasmon-enabled devices such as ultra-small resonant structures

4. 7247846 - Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

5. 6998606 - Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

6. 6867414 - Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

7. 5818041 - Mass spectrometer system and method for transporting and analyzing ions

8. 5793038 - Method of operating an ion trap mass spectrometer

9. 5729014 - Method for injection of externally produced ions into a quadrupole ion

10. 5672868 - Mass spectrometer system and method for transporting and analyzing ions

11. 5569917 - Apparatus for and method of forming a parallel ion beam

12. 5506412 - Means for reducing the contamination of mass spectrometer leak detection

13. 5300772 - Quadruple ion trap method having improved sensitivity

14. 4733073 - Method and apparatus for surface diagnostics

15. H000414 - Surface ionization source

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as of
12/8/2025
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