Qualcomm Incorporated

Siddharth Kamath

Raghu Narayan Challa

Mihir Vijay Laghate

Mingming Cai

Revathi Sundara Raghavan

Michael Burke

Vasanthan Raghavan

Mohammad Ali Tassoudji

Shrenik Patel

Sang-June Park

Sudarsan Krishnan

Abhilash Bangalore Ravi

Various aspects of the present disclosure generally relate to wireless communication and testing. In some aspects, a device may receive information identifying a mount orientation of a wireless communication device, wherein the mount orientation indicates an orientation of a coordinate system of the wireless communication device relative to a coordinate system of a positioner. The device may capture measurement information at each position of a set of positions of the wireless communication device, wherein the set of positions comprises positions of the wireless communication device as the wireless communication device is rotated around an axis by the positioner, and wherein the measurement information is captured based at least in part on the mount orientation. The device may provide information identifying the measurement information. Some techniques and apparatuses described herein may use the measurement information to generate a codebook for beam generation. Numerous other aspects are provided.

Beam characterization

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a UE may communicate via a serving beam set of the UE, the serving beam set being one or more of a plurality of beams. The UE may measure another beam set in accordance with a measurement schedule configured to prioritize measurement on one or more adjacent beam sets associated with the serving beam set over one or more non-adjacent beam sets associated with the serving beam set. In some aspects, the one or more adjacent beam sets may be associated with one or more coverage areas that at least partially overlap a coverage area of the serving beam set, are adjacent to the coverage area of the serving beam set, or are associated with a measurement value that satisfies a threshold in the coverage area of the serving beam set. Numerous other aspects are provided.

Adjacent beam determination

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San Jose, CA, United States of America

Siddharth Kamath